{"id":"https://openalex.org/A5035408227","orcid":null,"observed_orcids":[],"display_name":"F.N. Cubaynes","raw_author_names":["Cubaynes, F.N.","Cubaynes, Florence N","F. Cubaynes","F. N. Cubaynes","F.N. Cubaynes","Florence Cubaynes","Florence N. Cubaynes"],"full_name":"Florence N. Cubaynes","works_count":33,"cited_by_count":533,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":11,"i10_index":12},"ids":{"openalex":"https://openalex.org/A5035408227","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I39063666","ror":"https://ror.org/03a64bh57","display_name":"University of Catania","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]},"years":[2000]},{"institution":{"id":"https://openalex.org/I4210122849","ror":"https://ror.org/02p2bgp27","display_name":"Philips (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]},"years":[2004,2001]},{"institution":{"id":"https://openalex.org/I4210159858","ror":"https://ror.org/05bsjqt55","display_name":"Philips (Belgium)","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210159858"]},"years":[2006,2005,2004,2003,2002,2001]}],"last_known_institutions":[{"id":"https://openalex.org/I4210159858","ror":"https://ror.org/05bsjqt55","display_name":"Philips (Belgium)","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210159858"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":30,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":22,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":12,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":11,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0001185,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":8.5e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":8.16e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":6.22e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":2.23e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8832747936248779},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.722281813621521},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5451338887214661},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.5086125135421753},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3543752431869507}],"counts_by_year":[{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2001,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":6,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":3,"cited_by_count":0},{"year":2004,"works_count":9,"oa_works_count":4,"cited_by_count":0},{"year":2005,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":14}],"display_name_alternatives":["Cubaynes, F.N.","Cubaynes, Florence N","F. Cubaynes","F. N. Cubaynes","F.N. Cubaynes","Florence Cubaynes","Florence N. Cubaynes"],"block_key":"f cubaynes","works_api_url":"https://api.openalex.org/works?filter=author.id:A5035408227","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}