{"id":"https://openalex.org/A5035170493","orcid":"https://orcid.org/0000-0002-9516-3077","observed_orcids":["https://orcid.org/0000-0002-9516-3077"],"display_name":"Leszek Bychto","raw_author_names":["Bychto Leszek","Bychto, Leszek","L Bychto","L. Bychto","Leszek BYCHTO","Leszek Bychto"],"full_name":"Leszek Bychto","works_count":63,"cited_by_count":277,"summary_stats":{"2yr_mean_citedness":1.8333333333333333,"h_index":8,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5035170493","orcid":"https://orcid.org/0000-0002-9516-3077","observed_orcids":["https://orcid.org/0000-0002-9516-3077"]},"affiliations":[{"institution":{"id":"https://openalex.org/I269685040","ror":"https://ror.org/00x6dk626","display_name":"Koszalin University of Technology","country_code":"PL","type":"education","lineage":["https://openalex.org/I269685040"]},"years":[2026,2025,2024,2023,2022,2021,2019,2018,2017,2016,2015,2014,2013,2010,2009,2008,2005,2004,2002,2001,1998]},{"institution":{"id":"https://openalex.org/I60053951","ror":"https://ror.org/01460j859","display_name":"Universitat Polit\u00e8cnica de Val\u00e8ncia","country_code":"ES","type":"education","lineage":["https://openalex.org/I60053951"]},"years":[2008]}],"last_known_institutions":[{"id":"https://openalex.org/I269685040","ror":"https://ror.org/00x6dk626","display_name":"Koszalin University of Technology","country_code":"PL","type":"education","lineage":["https://openalex.org/I269685040"]}],"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","count":25,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","count":16,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","count":12,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":12,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","value":0.0002474,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","value":0.0001141,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13493","display_name":"Optical and Acousto-Optic Technologies","value":8.99e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":7.03e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","value":6.73e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9131536483764648},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.7450215220451355},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5975782871246338},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5849905014038086},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.44489800930023193}],"counts_by_year":[{"year":1998,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":9},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":2,"oa_works_count":1,"cited_by_count":4},{"year":2017,"works_count":2,"oa_works_count":1,"cited_by_count":6},{"year":2018,"works_count":4,"oa_works_count":3,"cited_by_count":14},{"year":2019,"works_count":2,"oa_works_count":2,"cited_by_count":11},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":15},{"year":2021,"works_count":4,"oa_works_count":3,"cited_by_count":33},{"year":2022,"works_count":3,"oa_works_count":3,"cited_by_count":20},{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":24},{"year":2024,"works_count":5,"oa_works_count":3,"cited_by_count":19},{"year":2025,"works_count":5,"oa_works_count":4,"cited_by_count":26},{"year":2026,"works_count":2,"oa_works_count":2,"cited_by_count":39}],"display_name_alternatives":["Bychto Leszek","Bychto, Leszek","L Bychto","L. Bychto","Leszek BYCHTO","Leszek Bychto"],"block_key":"l bychto","works_api_url":"https://api.openalex.org/works?filter=author.id:A5035170493","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5035170493","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}