{"id":"https://openalex.org/A5034470185","orcid":"https://orcid.org/0000-0002-6031-9748","observed_orcids":["https://orcid.org/0000-0002-6031-9748"],"display_name":"Bojan A\u010dko","raw_author_names":["Acko, Bojan","A\u010dko, Bojan","B A\u010dko","B. Acko","B. A\u010dko","Bojan Acko","Bojan A\u010dko"],"full_name":"A\u010dko, Bojan","works_count":101,"cited_by_count":628,"summary_stats":{"2yr_mean_citedness":0.7777777777777778,"h_index":15,"i10_index":22},"ids":{"openalex":"https://openalex.org/A5034470185","orcid":"https://orcid.org/0000-0002-6031-9748","observed_orcids":["https://orcid.org/0000-0002-6031-9748"]},"affiliations":[{"institution":{"id":"https://openalex.org/I11923345","ror":"https://ror.org/008fyn775","display_name":"Wroc\u0142aw University of Science and Technology","country_code":"PL","type":"education","lineage":["https://openalex.org/I11923345"]},"years":[2021,2016]},{"institution":{"id":"https://openalex.org/I1285933455","ror":"https://ror.org/05r3f7h03","display_name":"Physikalisch-Technische Bundesanstalt","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I134421475","ror":"https://ror.org/015w2mp89","display_name":"National Physical Laboratory","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I167672880","ror":"https://ror.org/038680g19","display_name":"Federal Office of Metrology and Surveying","country_code":"AT","type":"government","lineage":["https://openalex.org/I167672880"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I37696226","ror":"https://ror.org/01d5jce07","display_name":"University of Maribor","country_code":"SI","type":"education","lineage":["https://openalex.org/I37696226"]},"years":[2026,2025,2024,2021,2020,2019,2018,2017,2016,2015,2014,2013,2012,2011,2010,2009,2006,2005,2004,1994]},{"institution":{"id":"https://openalex.org/I4210102418","ror":"https://ror.org/01eaav933","display_name":"Metrology Institute of the Republic of Slovenia","country_code":"SI","type":"government","lineage":["https://openalex.org/I4210102418"]},"years":[2025,2015]},{"institution":{"id":"https://openalex.org/I4210162737","ror":"https://ror.org/050n06q35","display_name":"Gorenje (Slovenia)","country_code":"SI","type":"company","lineage":["https://openalex.org/I4210162737"]},"years":[2015,2014]}],"last_known_institutions":[{"id":"https://openalex.org/I37696226","ror":"https://ror.org/01d5jce07","display_name":"University of Maribor","country_code":"SI","type":"education","lineage":["https://openalex.org/I37696226"]}],"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":81,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":79,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":24,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13511","display_name":"Geodetic Measurements and Engineering Structures","count":14,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":0.0004195,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":0.0003528,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13511","display_name":"Geodetic Measurements and Engineering Structures","value":9.63e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":8.54e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":7.76e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.9405365586280823},{"id":"165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","score":0.8723999857902527},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7854779958724976},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.53908771276474},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.47015050053596497}],"counts_by_year":[{"year":1994,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":9,"oa_works_count":8,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2006,"works_count":5,"oa_works_count":5,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":2011,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":22,"oa_works_count":20,"cited_by_count":22},{"year":2013,"works_count":3,"oa_works_count":2,"cited_by_count":18},{"year":2014,"works_count":6,"oa_works_count":3,"cited_by_count":27},{"year":2015,"works_count":6,"oa_works_count":5,"cited_by_count":43},{"year":2016,"works_count":2,"oa_works_count":2,"cited_by_count":32},{"year":2017,"works_count":5,"oa_works_count":3,"cited_by_count":36},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":47},{"year":2019,"works_count":3,"oa_works_count":2,"cited_by_count":26},{"year":2020,"works_count":8,"oa_works_count":5,"cited_by_count":67},{"year":2021,"works_count":2,"oa_works_count":2,"cited_by_count":76},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":74},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":50},{"year":2024,"works_count":3,"oa_works_count":3,"cited_by_count":36},{"year":2025,"works_count":3,"oa_works_count":2,"cited_by_count":35},{"year":2026,"works_count":3,"oa_works_count":3,"cited_by_count":22}],"display_name_alternatives":["Acko, Bojan","A\u010dko, Bojan","B A\u010dko","B. Acko","B. A\u010dko","Bojan Acko","Bojan A\u010dko"],"block_key":"b acko","works_api_url":"https://api.openalex.org/works?filter=author.id:A5034470185","updated_date":"2026-11-02T12:28:04","created_date":"2016-06-24T00:00:00"}