{"id":"https://openalex.org/A5033341877","orcid":"https://orcid.org/0009-0009-5275-1379","observed_orcids":["https://orcid.org/0009-0009-5275-1379"],"display_name":"Micha\u0142 Nawotka","raw_author_names":["M Nawotka","M. Nawotka","MICHA\u0141 NAWOTKA","Michal Nawotka","Micha\u0142 Nawotka","Nawotka, Michal"],"full_name":"MICHA\u0141 NAWOTKA","works_count":14,"cited_by_count":50,"summary_stats":{"2yr_mean_citedness":3.625,"h_index":4,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5033341877","orcid":"https://orcid.org/0009-0009-5275-1379","observed_orcids":["https://orcid.org/0009-0009-5275-1379"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210142792","ror":"https://ror.org/039f8sh24","display_name":"Central Office of Measures","country_code":"PL","type":"government","lineage":["https://openalex.org/I4210142792"]},"years":[2026,2025,2024,2023,2022,2021]}],"last_known_institutions":[{"id":"https://openalex.org/I4210142792","ror":"https://ror.org/039f8sh24","display_name":"Central Office of Measures","country_code":"PL","type":"government","lineage":["https://openalex.org/I4210142792"]}],"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","count":6,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":4,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","count":3,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":4.38e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","value":2.68e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":2.59e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":1.8e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":1.34e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","score":0.8088370561599731},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5478432774543762},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.46000000834465027},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.45914411544799805},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.17473816871643066}],"counts_by_year":[{"year":2021,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":6},{"year":2024,"works_count":3,"oa_works_count":1,"cited_by_count":7},{"year":2025,"works_count":3,"oa_works_count":3,"cited_by_count":13},{"year":2026,"works_count":2,"oa_works_count":1,"cited_by_count":21}],"display_name_alternatives":["M Nawotka","M. Nawotka","MICHA\u0141 NAWOTKA","Michal Nawotka","Micha\u0142 Nawotka","Nawotka, Michal"],"block_key":"m nawotka","works_api_url":"https://api.openalex.org/works?filter=author.id:A5033341877","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5033341877","updated_date":"2026-11-12T13:17:38","created_date":"2021-08-16T00:00:00"}