{"id":"https://openalex.org/A5032184243","orcid":null,"observed_orcids":[],"display_name":"Koen De Munck","raw_author_names":["De Munck, Koen","K De Munck","K. De Munck","Koen De Munck","Koen Munck","Koen de Munck"],"full_name":"Koen de Munck","works_count":52,"cited_by_count":626,"summary_stats":{"2yr_mean_citedness":4.111111111111111,"h_index":12,"i10_index":18},"ids":{"openalex":"https://openalex.org/A5032184243","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210114974","ror":"https://ror.org/02kcbn207","display_name":"IMEC","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},"years":[2026,2024,2022,2020,2018,2017,2016,2015,2014,2012,2011,2010,2009,2008,2007,2006,2005,2004]},{"institution":{"id":"https://openalex.org/I99464096","ror":"https://ror.org/05f950310","display_name":"KU Leuven","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},"years":[2008,2007]}],"last_known_institutions":[{"id":"https://openalex.org/I4210114974","ror":"https://ror.org/02kcbn207","display_name":"IMEC","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":35,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":24,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":19,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":18,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","count":14,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":0.0004041,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":0.0002256,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":0.0001072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","value":5.17e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","value":3.62e-05,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9407682418823242},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.791100025177002},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7444354295730591},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6691279411315918},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5459285974502563}],"counts_by_year":[{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":8,"oa_works_count":3,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":8,"oa_works_count":2,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":41},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":39},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":31},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":37},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":35},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":28},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":22},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":22},{"year":2020,"works_count":1,"oa_works_count":1,"cited_by_count":20},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":27},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2024,"works_count":8,"oa_works_count":8,"cited_by_count":37},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":23}],"display_name_alternatives":["De Munck, Koen","K De Munck","K. De Munck","Koen De Munck","Koen Munck","Koen de Munck"],"block_key":"k munck","works_api_url":"https://api.openalex.org/works?filter=author.id:A5032184243","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}