{"id":"https://openalex.org/A5031915323","orcid":"https://orcid.org/0000-0002-8515-971X","observed_orcids":["https://orcid.org/0000-0002-8515-971X"],"display_name":"Han-Hee Lee","raw_author_names":["Han-Hee Lee"],"full_name":"Han-Hee Lee","works_count":3,"cited_by_count":10,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5031915323","orcid":"https://orcid.org/0000-0002-8515-971X","observed_orcids":["https://orcid.org/0000-0002-8515-971X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I24456540","ror":"https://ror.org/05jmm0651","display_name":"Korea Aerospace University","country_code":"KR","type":"education","lineage":["https://openalex.org/I24456540"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I4210165268","ror":"https://ror.org/05aykjy67","display_name":"Korea Testing Laboratory","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210165268"]},"years":[2025,2024,2023]},{"institution":{"id":"https://openalex.org/I4575257","ror":"https://ror.org/046865y68","display_name":"Hanyang University","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]},"years":[2023]},{"institution":{"id":"https://openalex.org/I70591777","ror":"https://ror.org/015v9d997","display_name":"Jeonju University","country_code":"KR","type":"education","lineage":["https://openalex.org/I70591777"]},"years":[2024]}],"last_known_institutions":[{"id":"https://openalex.org/I4210165268","ror":"https://ror.org/05aykjy67","display_name":"Korea Testing Laboratory","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210165268"]}],"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","count":2,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13470","display_name":"Surface Treatment and Coatings","count":1,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","value":2.01e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":1.96e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":1.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13470","display_name":"Surface Treatment and Coatings","value":2.6e-06,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","value":2.5e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8764479160308838},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.7571359872817993},{"id":"2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","score":0.7537131905555725},{"id":"113078167","wikidata":"https://www.wikidata.org/wiki/Q3699481","display_name":"Shielding effect","score":0.5740886330604553},{"id":"107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","score":0.5259573459625244}],"counts_by_year":[{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["Han-Hee Lee"],"block_key":"h lee","works_api_url":"https://api.openalex.org/works?filter=author.id:A5031915323","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2023-02-09T00:00:00"}