{"id":"https://openalex.org/A5031572906","orcid":null,"observed_orcids":[],"display_name":"Roelof Hamberg","raw_author_names":["Hamberg, Roelof","R Hamberg","R. Hamberg","Roelof Hamberg"],"full_name":"Hamberg, Roelof","works_count":57,"cited_by_count":1615,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":14,"i10_index":17},"ids":{"openalex":"https://openalex.org/A5031572906","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I121797337","ror":"https://ror.org/027bh9e22","display_name":"Leiden University","country_code":"NL","type":"education","lineage":["https://openalex.org/I121797337"]},"years":[1992,1991,1990]},{"institution":{"id":"https://openalex.org/I4210093425","ror":"https://ror.org/00560h931","display_name":"Tio Business School","country_code":"NL","type":"education","lineage":["https://openalex.org/I4210093425"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I83019370","ror":"https://ror.org/02c2kyt77","display_name":"Eindhoven University of Technology","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]},"years":[2011,1998]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","count":21,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10427","display_name":"Visual perception and processing mechanisms","count":17,"subfield":{"id":"https://openalex.org/subfields/2805","display_name":"Cognitive Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization","count":10,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","count":9,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","value":0.000127,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization","value":6.43e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13638","display_name":"Human auditory perception and evaluation","value":6.36e-05,"subfield":{"id":"https://openalex.org/subfields/3102","display_name":"Acoustics and Ultrasonics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","value":4.85e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","value":4.02e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.9601294994354248},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8959541320800781},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6988997459411621},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6190712451934814},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.47797080874443054}],"counts_by_year":[{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1994,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":11,"oa_works_count":3,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":6,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":118},{"year":2013,"works_count":6,"oa_works_count":2,"cited_by_count":75},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":97},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":81},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":75},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":64},{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":56},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":44},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":39},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":49},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":58},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":39},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":19}],"display_name_alternatives":["Hamberg, Roelof","R Hamberg","R. Hamberg","Roelof Hamberg"],"block_key":"r hamberg","works_api_url":"https://api.openalex.org/works?filter=author.id:A5031572906","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}