{"id":"https://openalex.org/A5031148101","orcid":null,"observed_orcids":[],"display_name":"Marcel Broekaart","raw_author_names":["Broekaart, M.","M Broekaart","M. Broekaart","M. E. I. Broekaart","M.E.I. Broekaart","Marcel Broekaart"],"full_name":"Marcel Broekaart","works_count":34,"cited_by_count":1167,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":14,"i10_index":17},"ids":{"openalex":"https://openalex.org/A5031148101","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I108523894","ror":"https://ror.org/00s730510","display_name":"Soitec (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I108523894"]},"years":[2026,2013,2012,2011]},{"institution":{"id":"https://openalex.org/I4210104693","ror":"https://ror.org/01c74sd89","display_name":"STMicroelectronics (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},"years":[2007,2004]},{"institution":{"id":"https://openalex.org/I4210122849","ror":"https://ror.org/02p2bgp27","display_name":"Philips (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]},"years":[2006,2003,1990,1989,1988]},{"institution":{"id":"https://openalex.org/I4210163196","ror":"https://ror.org/0532vdr17","display_name":"Signify (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210163196"]},"years":[1990,1988]},{"institution":{"id":"https://openalex.org/I4210165709","ror":"https://ror.org/05jz46060","display_name":"Philips (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]},"years":[2007,2006,2005,2004,2003]},{"institution":{"id":"https://openalex.org/I98358874","ror":"https://ror.org/02e2c7k09","display_name":"Delft University of Technology","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]},"years":[1989]}],"last_known_institutions":[{"id":"https://openalex.org/I108523894","ror":"https://ror.org/00s730510","display_name":"Soitec (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I108523894"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":16,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":9.26e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":8.27e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":6.91e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","value":4.25e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":3.71e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9347494840621948},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.8241147994995117},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6803914308547974},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6180046796798706},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.328000009059906}],"counts_by_year":[{"year":1988,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1989,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1990,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":8,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":36},{"year":2013,"works_count":2,"oa_works_count":1,"cited_by_count":40},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":36},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":25},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":25},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":14}],"display_name_alternatives":["Broekaart, M.","M Broekaart","M. Broekaart","M. E. I. Broekaart","M.E.I. Broekaart","Marcel Broekaart"],"block_key":"m broekaart","works_api_url":"https://api.openalex.org/works?filter=author.id:A5031148101","awards_count":0,"updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}
