{"id":"https://openalex.org/A5029511237","orcid":"https://orcid.org/0009-0004-3906-6776","observed_orcids":["https://orcid.org/0009-0004-3906-6776"],"display_name":"Yumin Chen","raw_author_names":["Yumin Chen"],"full_name":"Yumin Chen","works_count":2,"cited_by_count":10,"summary_stats":{"2yr_mean_citedness":5.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5029511237","orcid":"https://orcid.org/0009-0004-3906-6776","observed_orcids":["https://orcid.org/0009-0004-3906-6776"]},"affiliations":[{"institution":{"id":"https://openalex.org/I21642278","ror":"https://ror.org/04j7b2v61","display_name":"Ningxia University","country_code":"CN","type":"education","lineage":["https://openalex.org/I21642278"]},"years":[2024]}],"last_known_institutions":[{"id":"https://openalex.org/I21642278","ror":"https://ror.org/04j7b2v61","display_name":"Ningxia University","country_code":"CN","type":"education","lineage":["https://openalex.org/I21642278"]}],"topics":[{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":1,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12740","display_name":"Gait Recognition and Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13715","display_name":"Power Line Inspection Robots","value":4.22e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12740","display_name":"Gait Recognition and Analysis","value":1.7e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":5.2e-06,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","value":4.9e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.8e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","score":0.5773078203201294},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5375674962997437},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.18372073769569397},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.13618052005767822},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.12572556734085083}],"counts_by_year":[{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":10}],"display_name_alternatives":["Yumin Chen"],"block_key":"y chen","works_api_url":"https://api.openalex.org/works?filter=author.id:A5029511237","updated_date":"2026-10-10T12:59:14","created_date":"2025-10-10T00:00:00"}