{"id":"https://openalex.org/A5028986927","orcid":"https://orcid.org/0000-0002-9842-528X","observed_orcids":["https://orcid.org/0000-0002-9842-528X"],"display_name":"Dmitriy V. Likhachev","raw_author_names":["D. V. Likhachev","D.V. LIKHACHEV","D.V. Likhachev","Dmitriy Likhachev","Dmitriy V.","Dmitriy V. Likhachev","Dmitry Likhachev","Likhachev, Dmitriy V"],"full_name":"Dmitriy V. Likhachev","works_count":33,"cited_by_count":273,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":9},"ids":{"openalex":"https://openalex.org/A5028986927","orcid":"https://orcid.org/0000-0002-9842-528X","observed_orcids":["https://orcid.org/0000-0002-9842-528X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I130823665","ror":"https://ror.org/00hs7dr46","display_name":"Ural Federal University","country_code":"RU","type":"education","lineage":["https://openalex.org/I130823665"]},"years":[1996]},{"institution":{"id":"https://openalex.org/I4210094722","ror":"https://ror.org/00tbs6p91","display_name":"Center for Nanoscale Science and Technology","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210094722"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I4210142027","ror":"https://ror.org/045jad561","display_name":"GlobalFoundries (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]},"years":[2026,2024,2023,2022,2021,2019,2018,2017,2016,2015,2014,2013,2012]}],"last_known_institutions":[{"id":"https://openalex.org/I4210142027","ror":"https://ror.org/045jad561","display_name":"GlobalFoundries (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]}],"topics":[{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","count":26,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","count":13,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":9,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","value":0.0002903,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":9.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":7.77e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","value":4.37e-05,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":3.95e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7061154246330261},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6548390984535217},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5543370842933655},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5339623093605042},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.5135416984558105}],"counts_by_year":[{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2015,"works_count":4,"oa_works_count":1,"cited_by_count":6},{"year":2016,"works_count":2,"oa_works_count":0,"cited_by_count":9},{"year":2017,"works_count":6,"oa_works_count":0,"cited_by_count":15},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":14},{"year":2019,"works_count":3,"oa_works_count":0,"cited_by_count":24},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":41},{"year":2022,"works_count":2,"oa_works_count":1,"cited_by_count":33},{"year":2023,"works_count":3,"oa_works_count":0,"cited_by_count":38},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":29},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":18}],"display_name_alternatives":["D. V. Likhachev","D.V. LIKHACHEV","D.V. Likhachev","Dmitriy Likhachev","Dmitriy V.","Dmitriy V. Likhachev","Dmitry Likhachev","Likhachev, Dmitriy V"],"block_key":"d likhachev","works_api_url":"https://api.openalex.org/works?filter=author.id:A5028986927","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5028986927","updated_date":"2026-11-13T15:08:24","created_date":"2016-06-24T00:00:00"}