{"id":"https://openalex.org/A5028265686","orcid":"https://orcid.org/0000-0002-6928-8191","observed_orcids":["https://orcid.org/0000-0002-6928-8191"],"display_name":"Manoj Kumar Majumder","raw_author_names":["M. K. Majumder","M. Majumder","M.K. Majumder","Manoi Kumar Maiumder","Manoj K. Majumder","Manoj Kumar Majumder"],"full_name":"Manoj Kumar Majumder","works_count":140,"cited_by_count":1879,"summary_stats":{"2yr_mean_citedness":2.7222222222222223,"h_index":20,"i10_index":43},"ids":{"openalex":"https://openalex.org/A5028265686","orcid":"https://orcid.org/0000-0002-6928-8191","observed_orcids":["https://orcid.org/0000-0002-6928-8191"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1288043984","ror":"https://ror.org/00v1y6t69","display_name":"Techno India University","country_code":"IN","type":"education","lineage":["https://openalex.org/I1288043984"]},"years":[2016]},{"institution":{"id":"https://openalex.org/I154851008","ror":"https://ror.org/00582g326","display_name":"Indian Institute of Technology Roorkee","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]},"years":[2015,2014,2013,2012,2011]},{"institution":{"id":"https://openalex.org/I178254495","ror":"https://ror.org/04q4j2f69","display_name":"Dayalbagh Educational Institute","country_code":"IN","type":"education","lineage":["https://openalex.org/I178254495"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I188963388","ror":"https://ror.org/02dernx73","display_name":"International Institute of Information Technology","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]},"years":[2026,2019]},{"institution":{"id":"https://openalex.org/I253188195","ror":"https://ror.org/05gnvg690","display_name":"Deenbandhu Chhotu Ram University of Science and Technology","country_code":"IN","type":"education","lineage":["https://openalex.org/I253188195"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I4387155265","ror":"https://ror.org/016kfyg29","display_name":"International Institute of Information Technology","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4387155265"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017]},{"institution":{"id":"https://openalex.org/I94234084","ror":"https://ror.org/05pjsgx75","display_name":"Indian Institute of Technology Kanpur","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]},"years":[2010]}],"last_known_institutions":[{"id":"https://openalex.org/I188963388","ror":"https://ror.org/02dernx73","display_name":"International Institute of Information Technology","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]},{"id":"https://openalex.org/I4387155265","ror":"https://ror.org/016kfyg29","display_name":"International Institute of Information Technology","country_code":"IN","type":"facility","lineage":["https://openalex.org/I4387155265"]}],"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","count":73,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":66,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":59,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":41,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","count":29,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0006515,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","value":0.0004966,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":0.0004842,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":0.0002191,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":0.0002185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9171510338783264},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6761627197265625},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.635482907295227},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5741558074951172},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.44137459993362427}],"counts_by_year":[{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":21,"oa_works_count":0,"cited_by_count":26},{"year":2013,"works_count":3,"oa_works_count":2,"cited_by_count":19},{"year":2014,"works_count":19,"oa_works_count":2,"cited_by_count":44},{"year":2015,"works_count":7,"oa_works_count":0,"cited_by_count":79},{"year":2016,"works_count":8,"oa_works_count":0,"cited_by_count":66},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":86},{"year":2018,"works_count":3,"oa_works_count":0,"cited_by_count":120},{"year":2019,"works_count":9,"oa_works_count":0,"cited_by_count":196},{"year":2020,"works_count":20,"oa_works_count":0,"cited_by_count":194},{"year":2021,"works_count":5,"oa_works_count":1,"cited_by_count":146},{"year":2022,"works_count":11,"oa_works_count":4,"cited_by_count":176},{"year":2023,"works_count":9,"oa_works_count":2,"cited_by_count":140},{"year":2024,"works_count":9,"oa_works_count":0,"cited_by_count":175},{"year":2025,"works_count":4,"oa_works_count":1,"cited_by_count":214},{"year":2026,"works_count":5,"oa_works_count":1,"cited_by_count":123}],"display_name_alternatives":["M. K. Majumder","M. Majumder","M.K. Majumder","Manoi Kumar Maiumder","Manoj K. Majumder","Manoj Kumar Majumder"],"block_key":"m majumder","works_api_url":"https://api.openalex.org/works?filter=author.id:A5028265686","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5028265686","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}