{"id":"https://openalex.org/A5026817153","orcid":null,"observed_orcids":[],"display_name":"Kai Meng Hock","raw_author_names":["Hock, K.","Hock, K.M","Hock, Kai","K M Hock","K. Hock","K. M. Hock","K.M. Hock","K.\u2009M. Hock","Kai Meng Hock"],"full_name":"Kai Meng Hock","works_count":63,"cited_by_count":964,"summary_stats":{"2yr_mean_citedness":32.5,"h_index":18,"i10_index":22},"ids":{"openalex":"https://openalex.org/A5026817153","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1289243028","ror":"https://ror.org/01qz5mb56","display_name":"Oak Ridge National Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]},"years":[1993]},{"institution":{"id":"https://openalex.org/I146655781","ror":"https://ror.org/04xs57h96","display_name":"University of Liverpool","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]},"years":[2014,2013,2012,2011,2010,2009,2008,2007,1991]},{"institution":{"id":"https://openalex.org/I165932596","ror":"https://ror.org/01tgyzw49","display_name":"National University of Singapore","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},"years":[2006,2005,2003]},{"institution":{"id":"https://openalex.org/I191738243","ror":"https://ror.org/02a5smf05","display_name":"Cockcroft Institute","country_code":"GB","type":"education","lineage":["https://openalex.org/I191738243"]},"years":[2014,2013,2012,2011,2009,2007]},{"institution":{"id":"https://openalex.org/I241749","ror":"https://ror.org/013meh722","display_name":"University of Cambridge","country_code":"GB","type":"education","lineage":["https://openalex.org/I241749"]},"years":[1993,1992,1991]},{"institution":{"id":"https://openalex.org/I2802015276","ror":"https://ror.org/0089bg420","display_name":"Daresbury Laboratory","country_code":"GB","type":"facility","lineage":["https://openalex.org/I162524378","https://openalex.org/I2802015276","https://openalex.org/I4210087105"]},"years":[2013,2012]},{"institution":{"id":"https://openalex.org/I28407311","ror":"https://ror.org/027m9bs27","display_name":"University of Manchester","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I4210102012","ror":"https://ror.org/015ff4823","display_name":"Sci-Tech Daresbury","country_code":"GB","type":"facility","lineage":["https://openalex.org/I4210102012"]},"years":[2014,2011]},{"institution":{"id":"https://openalex.org/I4405277765","ror":"https://ror.org/03tg9kr68","display_name":"Temasek Laboratories","country_code":"SG","type":"facility","lineage":["https://openalex.org/I4405277765"]},"years":[2006,2005,2003]},{"institution":{"id":"https://openalex.org/I67311998","ror":"https://ror.org/01ggx4157","display_name":"European Organization for Nuclear Research","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]},"years":[2025]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","count":35,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","count":27,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","count":13,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10048","display_name":"Particle physics theoretical and experimental studies","count":7,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","value":0.0001479,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","value":0.0001018,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12285","display_name":"Surface Chemistry and Catalysis","value":4.55e-05,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","value":3.01e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":2.98e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.8749589323997498},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6549251079559326},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.6382719874382019},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4657999873161316},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.2844758629798889}],"counts_by_year":[{"year":1991,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1992,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":7,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2011,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":1,"cited_by_count":26},{"year":2013,"works_count":6,"oa_works_count":4,"cited_by_count":46},{"year":2014,"works_count":8,"oa_works_count":8,"cited_by_count":37},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":27},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2025,"works_count":5,"oa_works_count":5,"cited_by_count":64},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":169}],"display_name_alternatives":["Hock, K.","Hock, K.M","Hock, Kai","K M Hock","K. Hock","K. M. Hock","K.M. Hock","K.\u2009M. Hock","Kai Meng Hock"],"block_key":"k hock","works_api_url":"https://api.openalex.org/works?filter=author.id:A5026817153","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5026817153","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}