{"id":"https://openalex.org/A5026626459","orcid":null,"observed_orcids":[],"display_name":"K. Berresheim","raw_author_names":["K. Berresheim","K. H. Berresheim","K.H. Berresheim"],"full_name":"K. H. Berresheim","works_count":15,"cited_by_count":352,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5026626459","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I153267046","ror":"https://ror.org/04zrf7b53","display_name":"University of Kaiserslautern","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046","https://openalex.org/I4387152675"]},"years":[2003,1997]},{"institution":{"id":"https://openalex.org/I180923762","ror":"https://ror.org/00rcxh774","display_name":"University of Cologne","country_code":"DE","type":"education","lineage":["https://openalex.org/I180923762"]},"years":[1967]},{"institution":{"id":"https://openalex.org/I4210088365","ror":"https://ror.org/005bk2339","display_name":"Max Planck Institute for Solid State Research","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210088365"]},"years":[1976]},{"institution":{"id":"https://openalex.org/I4210155686","ror":"https://ror.org/051tn6h07","display_name":"Heraeus (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210155686"]},"years":[1984,1983,1979]},{"institution":{"id":"https://openalex.org/I4387155129","ror":"https://ror.org/05rw01c09","display_name":"Institut f\u00fcr Oberfl\u00e4chen- und Schichtanalytik GmbH","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4387152675","https://openalex.org/I4387155129"]},"years":[2003,1997,1993]}],"last_known_institutions":[{"id":"https://openalex.org/I153267046","ror":"https://ror.org/04zrf7b53","display_name":"University of Kaiserslautern","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046","https://openalex.org/I4387152675"]},{"id":"https://openalex.org/I4387155129","ror":"https://ror.org/05rw01c09","display_name":"Institut f\u00fcr Oberfl\u00e4chen- und Schichtanalytik GmbH","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4387152675","https://openalex.org/I4387155129"]}],"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":12,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","count":6,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":6,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10192","display_name":"Catalytic Processes in Materials Science","count":3,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":2,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":3.58e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","value":2.75e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":1.61e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":1.3e-05,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13414","display_name":"Radioactive Decay and Measurement Techniques","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7993181943893433},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6818612217903137},{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.531922459602356},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.4302981495857239},{"id":"43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","score":0.20832860469818115}],"counts_by_year":[{"year":1967,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1976,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1984,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["K. Berresheim","K. H. Berresheim","K.H. Berresheim"],"block_key":"k berresheim","works_api_url":"https://api.openalex.org/works?filter=author.id:A5026626459","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}