{"id":"https://openalex.org/A5026554303","orcid":null,"observed_orcids":[],"display_name":"L. Arabe","raw_author_names":["L. Arabe"],"full_name":"L. Arabe","works_count":1,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5026554303","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I125485651","ror":"https://ror.org/017wv6808","display_name":"University Fr\u00e8res Mentouri Constantine 1","country_code":"DZ","type":"education","lineage":["https://openalex.org/I125485651"]},"years":[2011]}],"last_known_institutions":[{"id":"https://openalex.org/I125485651","ror":"https://ror.org/017wv6808","display_name":"University Fr\u00e8res Mentouri Constantine 1","country_code":"DZ","type":"education","lineage":["https://openalex.org/I125485651"]}],"topics":[{"id":"https://openalex.org/T10204","display_name":"Microstructure and mechanical properties","count":1,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14128","display_name":"Metallurgical and Alloy Processes","count":1,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":4.5e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14128","display_name":"Metallurgical and Alloy Processes","value":3.7e-06,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10204","display_name":"Microstructure and mechanical properties","value":3.2e-06,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6541231274604797},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.41066718101501465},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.2943193316459656},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.17539569735527039},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.166062593460083}],"counts_by_year":[{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["L. Arabe"],"block_key":"l arabe","works_api_url":"https://api.openalex.org/works?filter=author.id:A5026554303","updated_date":"2026-10-10T12:59:14","created_date":"2025-10-10T00:00:00"}