{"id":"https://openalex.org/A5025319457","orcid":"https://orcid.org/0000-0001-7942-1673","observed_orcids":["https://orcid.org/0000-0001-7942-1673"],"display_name":"Xiaoping Ren","raw_author_names":["Xiaoping Ren"],"full_name":"Xiaoping Ren","works_count":3,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5025319457","orcid":"https://orcid.org/0000-0001-7942-1673","observed_orcids":["https://orcid.org/0000-0001-7942-1673"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210126968","ror":"https://ror.org/02pzr0022","display_name":"National Center for Science and Technology Evaluation","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210120069","https://openalex.org/I4210126968","https://openalex.org/I4210127390"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I4210126968","ror":"https://ror.org/02pzr0022","display_name":"National Center for Science and Technology Evaluation","country_code":"CN","type":"government","lineage":["https://openalex.org/I4210120069","https://openalex.org/I4210126968","https://openalex.org/I4210127390"]}],"topics":[{"id":"https://openalex.org/T10102","display_name":"scientometrics and bibliometrics research","count":2,"subfield":{"id":"https://openalex.org/subfields/3309","display_name":"Library and Information Sciences"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10856","display_name":"Intellectual Property and Patents","count":2,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":1,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13851","display_name":"Law, AI, and Intellectual Property","value":1.12e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10856","display_name":"Intellectual Property and Patents","value":9.5e-06,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12722","display_name":"Innovation Policy and R&D","value":8e-06,"subfield":{"id":"https://openalex.org/subfields/2002","display_name":"Economics and Econometrics"},"field":{"id":"https://openalex.org/fields/20","display_name":"Economics, Econometrics and Finance"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":6.8e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":5.5e-06,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.569599986076355},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5393999814987183},{"id":"56739046","wikidata":"https://www.wikidata.org/wiki/Q192060","display_name":"Knowledge management","score":0.4620000123977661},{"id":"144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","score":0.36390000581741333},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.27194225788116455}],"counts_by_year":[{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2026,"works_count":2,"oa_works_count":2,"cited_by_count":0}],"display_name_alternatives":["Xiaoping Ren"],"block_key":"x ren","works_api_url":"https://api.openalex.org/works?filter=author.id:A5025319457","awards_count":0,"updated_date":"2026-10-28T12:34:19","created_date":"2023-01-20T00:00:00"}