{"id":"https://openalex.org/A5025265154","orcid":"https://orcid.org/0000-0002-6256-312X","observed_orcids":["https://orcid.org/0000-0002-6256-312X"],"display_name":"Pei Jiang Cao","raw_author_names":["P J Cao","P. J. Cao","P.-J. Cao","P.J. Cao","Pei Cao","Pei Jiang Cao"],"full_name":"Pei Jiang Cao","works_count":28,"cited_by_count":211,"summary_stats":{"2yr_mean_citedness":1.4,"h_index":8,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5025265154","orcid":"https://orcid.org/0000-0002-6256-312X","observed_orcids":["https://orcid.org/0000-0002-6256-312X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I126520041","ror":"https://ror.org/04c4dkn09","display_name":"University of Science and Technology of China","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},"years":[2021,2020]},{"institution":{"id":"https://openalex.org/I180726961","ror":"https://ror.org/01vy4gh70","display_name":"Shenzhen University","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]},"years":[2019,2018,2016,2015,2014,2013,2012]},{"institution":{"id":"https://openalex.org/I19820366","ror":"https://ror.org/034t30j35","display_name":"Chinese Academy of Sciences","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},"years":[2021,2020]},{"institution":{"id":"https://openalex.org/I2802624667","ror":"https://ror.org/046n57345","display_name":"Hefei Institutes of Physical Science","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I39774598","ror":"https://ror.org/01f5rdf64","display_name":"Hefei University","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]},"years":[2026,2024,2023]},{"institution":{"id":"https://openalex.org/I4391768032","ror":"https://ror.org/02bc1qd91","display_name":"State Key Laboratory of Mechanical Structure Strength and Vibration","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391768032","https://openalex.org/I87445476"]},"years":[2018,2017,2016]},{"institution":{"id":"https://openalex.org/I4405272976","ror":"https://ror.org/0525tbj84","display_name":"Guangdong Research Center for Interfacial Engineering of Functional Materials","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4405272976"]},"years":[2019,2018]},{"institution":{"id":"https://openalex.org/I87445476","ror":"https://ror.org/017zhmm22","display_name":"Xi'an Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]},"years":[2018,2017,2016]},{"institution":{"id":"https://openalex.org/I89652312","ror":"https://ror.org/0051rme32","display_name":"Northwest A&F University","country_code":"CN","type":"education","lineage":["https://openalex.org/I89652312"]},"years":[2023,2022]}],"last_known_institutions":[{"id":"https://openalex.org/I39774598","ror":"https://ror.org/01f5rdf64","display_name":"Hefei University","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","count":7,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10597","display_name":"Nuclear reactor physics and engineering","count":7,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","count":5,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","count":5,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","value":0.0001809,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","value":3.23e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","value":3e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12299","display_name":"Radiation Shielding Materials Analysis","value":3e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","value":2.38e-05,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9031506776809692},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7820974588394165},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7602051496505737},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5969598293304443},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.49447178840637207}],"counts_by_year":[{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2016,"works_count":3,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2018,"works_count":8,"oa_works_count":3,"cited_by_count":13},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":21},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":33},{"year":2021,"works_count":2,"oa_works_count":0,"cited_by_count":28},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":23},{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":21},{"year":2024,"works_count":3,"oa_works_count":1,"cited_by_count":22},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":23},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":17}],"display_name_alternatives":["P J Cao","P. J. Cao","P.-J. Cao","P.J. Cao","Pei Cao","Pei Jiang Cao"],"block_key":"p cao","works_api_url":"https://api.openalex.org/works?filter=author.id:A5025265154","updated_date":"2026-11-03T12:34:24","created_date":"2016-06-24T00:00:00"}