{"id":"https://openalex.org/A5024939674","orcid":"https://orcid.org/0009-0004-2606-3234","observed_orcids":["https://orcid.org/0009-0004-2606-3234"],"display_name":"Denghui Zhang","raw_author_names":["DengHui Zhang","Denghui Zhang"],"full_name":"DengHui Zhang","works_count":9,"cited_by_count":35,"summary_stats":{"2yr_mean_citedness":3.4285714285714284,"h_index":3,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5024939674","orcid":"https://orcid.org/0009-0004-2606-3234","observed_orcids":["https://orcid.org/0009-0004-2606-3234"]},"affiliations":[{"institution":{"id":"https://openalex.org/I108468826","ror":"https://ror.org/02z43xh36","display_name":"Stevens Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I108468826"]},"years":[2026,2025]},{"institution":{"id":"https://openalex.org/I157725225","ror":"https://ror.org/047426m28","display_name":"University of Illinois Urbana-Champaign","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I179026463","ror":"https://ror.org/013e0zm98","display_name":"Beijing Technology and Business University","country_code":"CN","type":"education","lineage":["https://openalex.org/I179026463"]},"years":[2026,2025,2024,2023]},{"institution":{"id":"https://openalex.org/I4210146077","ror":"https://ror.org/03qzxj964","display_name":"China National Institute of Standardization","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210146077"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I108468826","ror":"https://ror.org/02z43xh36","display_name":"Stevens Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I108468826"]},{"id":"https://openalex.org/I179026463","ror":"https://ror.org/013e0zm98","display_name":"Beijing Technology and Business University","country_code":"CN","type":"education","lineage":["https://openalex.org/I179026463"]},{"id":"https://openalex.org/I4210146077","ror":"https://ror.org/03qzxj964","display_name":"China National Institute of Standardization","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210146077"]}],"topics":[{"id":"https://openalex.org/T10028","display_name":"Topic Modeling","count":5,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10616","display_name":"Smart Agriculture and AI","count":2,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":2,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10181","display_name":"Natural Language Processing Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12380","display_name":"Authorship Attribution and Profiling","value":2.87e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10028","display_name":"Topic Modeling","value":1.01e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","value":9.8e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12026","display_name":"Explainable Artificial Intelligence (XAI)","value":9.7e-06,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":9.3e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7972000241279602},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6520000100135803},{"id":"204321447","wikidata":"https://www.wikidata.org/wiki/Q30642","display_name":"Natural language processing","score":0.582099974155426},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.552654504776001},{"id":"26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","score":0.32829999923706055}],"counts_by_year":[{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2025,"works_count":3,"oa_works_count":2,"cited_by_count":11},{"year":2026,"works_count":3,"oa_works_count":2,"cited_by_count":20}],"display_name_alternatives":["DengHui Zhang","Denghui Zhang"],"block_key":"d zhang","works_api_url":"https://api.openalex.org/works?filter=author.id:A5024939674","awards_count":0,"updated_date":"2026-11-08T12:57:04","created_date":"2023-11-09T00:00:00"}