{"id":"https://openalex.org/A5024333375","orcid":null,"observed_orcids":[],"display_name":"S. A. Kichik","raw_author_names":["S. A. Kichik","S.A.\u00a0Kichik","Sergey A. Kichik","\u0421. \u0410. \u041a\u0438\u0447\u0438\u043a","\u0421.\u0410. \u041a\u0438\u0447\u0438\u043a"],"full_name":"Sergey A. Kichik","works_count":12,"cited_by_count":47,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5024333375","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I3130270872","ror":"https://ror.org/05vkeks90","display_name":"Moscow Conservatory","country_code":"RU","type":"education","lineage":["https://openalex.org/I3130270872"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I4210123104","ror":"https://ror.org/02t41e292","display_name":"Russian Space Systems","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210123104"]},"years":[2017]}],"last_known_institutions":[{"id":"https://openalex.org/I3130270872","ror":"https://ror.org/05vkeks90","display_name":"Moscow Conservatory","country_code":"RU","type":"education","lineage":["https://openalex.org/I3130270872"]},{"id":"https://openalex.org/I4210123104","ror":"https://ror.org/02t41e292","display_name":"Russian Space Systems","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210123104"]}],"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","count":12,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","count":12,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","count":4,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","value":9.49e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","value":8.23e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":2.68e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","value":2.6e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":7e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9046740531921387},{"id":"2776578615","wikidata":"https://www.wikidata.org/wiki/Q5910801","display_name":"Hot pressing","score":0.599399983882904},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.5336999893188477},{"id":"191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","score":0.4690000116825104},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3807573914527893}],"counts_by_year":[{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2015,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":6,"oa_works_count":2,"cited_by_count":5},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5}],"display_name_alternatives":["S. A. Kichik","S.A.\u00a0Kichik","Sergey A. Kichik","\u0421. \u0410. \u041a\u0438\u0447\u0438\u043a","\u0421.\u0410. \u041a\u0438\u0447\u0438\u043a"],"block_key":"s kichik","works_api_url":"https://api.openalex.org/works?filter=author.id:A5024333375","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}