{"id":"https://openalex.org/A5021678136","orcid":"https://orcid.org/0000-0001-8320-3855","observed_orcids":["https://orcid.org/0000-0001-8320-3855"],"display_name":"Jiachuan Long","raw_author_names":["Jia-chuan Long","Jiachuan Long","Jiachuan Long -"],"full_name":"Jiachuan Long","works_count":18,"cited_by_count":300,"summary_stats":{"2yr_mean_citedness":11.0,"h_index":7,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5021678136","orcid":"https://orcid.org/0000-0001-8320-3855","observed_orcids":["https://orcid.org/0000-0001-8320-3855"]},"affiliations":[{"institution":{"id":"https://openalex.org/I37461747","ror":"https://ror.org/033vjfk17","display_name":"Wuhan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]},"years":[2017,2016]},{"institution":{"id":"https://openalex.org/I4210105877","ror":"https://ror.org/017swdq34","display_name":"Wuhan Donghu University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210105877"]},"years":[2026,2024,2023,2022,2021,2019,2018]}],"last_known_institutions":[{"id":"https://openalex.org/I4210105877","ror":"https://ror.org/017swdq34","display_name":"Wuhan Donghu University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210105877"]}],"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","count":2,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","value":5.43e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":5.04e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","value":2.96e-05,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":2.43e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":2.43e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.791313648223877},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7519709467887878},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.5606778860092163},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.5178999900817871},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4059031009674072}],"counts_by_year":[{"year":1990,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2016,"works_count":3,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":3,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":17},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":27},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":27},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":34},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":28},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":31},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":34},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":60},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":37}],"display_name_alternatives":["Jia-chuan Long","Jiachuan Long","Jiachuan Long -"],"block_key":"j long","works_api_url":"https://api.openalex.org/works?filter=author.id:A5021678136","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}