{"id":"https://openalex.org/A5020041267","orcid":null,"observed_orcids":[],"display_name":"Eric J. Skoug","raw_author_names":["E. J. Skoug","E. Skoug","Eric J. Skoug","Eric Skoug","Skoug, Eric John"],"full_name":"Skoug, Eric John","works_count":20,"cited_by_count":1502,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":14,"i10_index":15},"ids":{"openalex":"https://openalex.org/A5020041267","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I118136607","ror":"https://ror.org/05addee68","display_name":"General Motors (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I118136607"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I87216513","ror":"https://ror.org/05hs6h993","display_name":"Michigan State University","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]},"years":[2012,2011,2010,2009]}],"last_known_institutions":[{"id":"https://openalex.org/I118136607","ror":"https://ror.org/05addee68","display_name":"General Motors (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I118136607"]}],"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","count":15,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","count":14,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10681","display_name":"Rare-earth and actinide compounds","count":3,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10939","display_name":"Crystal Structures and Properties","count":3,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","value":0.0001028,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","value":9.08e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":5.62e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12200","display_name":"Heusler alloys: electronic and magnetic properties","value":3.78e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12875","display_name":"Thermal Expansion and Ionic Conductivity","value":3.36e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8604912757873535},{"id":"63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","score":0.817473292350769},{"id":"97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","score":0.40255358815193176},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.38307252526283264},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.37324872612953186}],"counts_by_year":[{"year":2009,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":7,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":46},{"year":2013,"works_count":3,"oa_works_count":0,"cited_by_count":51},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":90},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":89},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":106},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":115},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":122},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":102},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":130},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":137},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":109},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":107},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":104},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":101},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":69}],"display_name_alternatives":["E. J. Skoug","E. Skoug","Eric J. Skoug","Eric Skoug","Skoug, Eric John"],"block_key":"e skoug","works_api_url":"https://api.openalex.org/works?filter=author.id:A5020041267","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5020041267","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}