{"id":"https://openalex.org/A5020041071","orcid":null,"observed_orcids":[],"display_name":"A. P. Stepovik","raw_author_names":["A. P. Stepovik","A.P. Stepovik","\u0410. \u041f. \u0421\u0442\u0435\u043f\u043e\u0432\u0438\u043a","\u0410.\u041f. \u0421\u0442\u0435\u043f\u043e\u0432\u0438\u043a"],"full_name":"A. P. Stepovik","works_count":20,"cited_by_count":18,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":3,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5020041071","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210130856","ror":"https://ror.org/02se2k984","display_name":"All-Russian Scientific Research Institute of Technical Physics","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210130856"]},"years":[2019,2018,2017,2007,2006,2005,2003]}],"last_known_institutions":[{"id":"https://openalex.org/I4210130856","ror":"https://ror.org/02se2k984","display_name":"All-Russian Scientific Research Institute of Technical Physics","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210130856"]}],"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":5,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","value":0.0001377,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":6.06e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":4.58e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","value":3.56e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","value":1.26e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.812005877494812},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7264900207519531},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5907618999481201},{"id":"185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","score":0.5177716016769409},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.3981381356716156}],"counts_by_year":[{"year":1971,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":1},{"year":2019,"works_count":4,"oa_works_count":1,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["A. P. Stepovik","A.P. Stepovik","\u0410. \u041f. \u0421\u0442\u0435\u043f\u043e\u0432\u0438\u043a","\u0410.\u041f. \u0421\u0442\u0435\u043f\u043e\u0432\u0438\u043a"],"block_key":"a stepovik","works_api_url":"https://api.openalex.org/works?filter=author.id:A5020041071","updated_date":"2026-11-01T11:00:13","created_date":"2016-06-24T00:00:00"}