{"id":"https://openalex.org/A5019856074","orcid":"https://orcid.org/0000-0002-6782-2004","observed_orcids":["https://orcid.org/0000-0002-6782-2004"],"display_name":"Jingwei Cheng","raw_author_names":["J W Cheng","Jing-Wei Cheng","Jingwei Cheng"],"full_name":"Jingwei Cheng","works_count":14,"cited_by_count":355,"summary_stats":{"2yr_mean_citedness":0.3333333333333333,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5019856074","orcid":"https://orcid.org/0000-0002-6782-2004","observed_orcids":["https://orcid.org/0000-0002-6782-2004"]},"affiliations":[{"institution":{"id":"https://openalex.org/I125839683","ror":"https://ror.org/01skt4w74","display_name":"Beijing Institute of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]},"years":[2017,2016,2014,2013]},{"institution":{"id":"https://openalex.org/I4210119102","ror":"https://ror.org/02jheyr43","display_name":"Hefei General Machinery Research Institute (China)","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210119102"]},"years":[2025,2024]},{"institution":{"id":"https://openalex.org/I59028903","ror":"https://ror.org/04rdtx186","display_name":"Ocean University of China","country_code":"CN","type":"education","lineage":["https://openalex.org/I59028903"]},"years":[2023]}],"last_known_institutions":[{"id":"https://openalex.org/I4210119102","ror":"https://ror.org/02jheyr43","display_name":"Hefei General Machinery Research Institute (China)","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210119102"]}],"topics":[{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","count":7,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","count":4,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","count":3,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11100","display_name":"Intermetallics and Advanced Alloy Properties","count":3,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","value":6.78e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11143","display_name":"High Entropy Alloys Studies","value":3.02e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":1.92e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11100","display_name":"Intermetallics and Advanced Alloy Properties","value":1.64e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","value":1.48e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9383937120437622},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.5620999932289124},{"id":"191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","score":0.42031028866767883},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.3283679187297821},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3184843361377716}],"counts_by_year":[{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":26},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":78},{"year":2016,"works_count":5,"oa_works_count":0,"cited_by_count":198},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":50},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2025,"works_count":2,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["J W Cheng","Jing-Wei Cheng","Jingwei Cheng"],"block_key":"j cheng","works_api_url":"https://api.openalex.org/works?filter=author.id:A5019856074","updated_date":"2026-10-16T12:29:29","created_date":"2017-08-31T00:00:00"}