{"id":"https://openalex.org/A5018458472","orcid":"https://orcid.org/0000-0001-7534-9790","observed_orcids":["https://orcid.org/0000-0001-7534-9790"],"display_name":"Xuemin Lu","raw_author_names":["Xuemin Lu"],"full_name":"Xuemin Lu","works_count":20,"cited_by_count":197,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5018458472","orcid":"https://orcid.org/0000-0001-7534-9790","observed_orcids":["https://orcid.org/0000-0001-7534-9790"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4387154110","ror":"https://ror.org/04jbf9x18","display_name":"Southwest China Institute of Electronic Technology","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4387154110"]},"years":[2025,2023]},{"institution":{"id":"https://openalex.org/I4800084","ror":"https://ror.org/00hn7w693","display_name":"Southwest Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]},"years":[2025,2023,2022,2021,2020,2019,2018]}],"last_known_institutions":[{"id":"https://openalex.org/I4387154110","ror":"https://ror.org/04jbf9x18","display_name":"Southwest China Institute of Electronic Technology","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4387154110"]},{"id":"https://openalex.org/I4800084","ror":"https://ror.org/00hn7w693","display_name":"Southwest Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":13,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":10,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13715","display_name":"Power Line Inspection Robots","count":7,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","count":5,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":4,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13715","display_name":"Power Line Inspection Robots","value":0.0002868,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","value":7.83e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":5.06e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","value":3.31e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12131","display_name":"Wireless Signal Modulation Classification","value":2.32e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8204028606414795},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7651144862174988},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6848250031471252},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.5908434987068176},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4388803243637085}],"counts_by_year":[{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2020,"works_count":4,"oa_works_count":3,"cited_by_count":1},{"year":2021,"works_count":3,"oa_works_count":1,"cited_by_count":6},{"year":2022,"works_count":6,"oa_works_count":0,"cited_by_count":15},{"year":2023,"works_count":3,"oa_works_count":0,"cited_by_count":28},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":45},{"year":2025,"works_count":2,"oa_works_count":2,"cited_by_count":61},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":41}],"display_name_alternatives":["Xuemin Lu"],"block_key":"x lu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5018458472","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2018-08-22T00:00:00"}