{"id":"https://openalex.org/A5017794978","orcid":"https://orcid.org/0000-0001-8577-4547","observed_orcids":["https://orcid.org/0000-0001-8577-4547"],"display_name":"C.K.M. Lee","raw_author_names":["C.K.M. Lee"],"full_name":"C.K.M. Lee","works_count":3,"cited_by_count":93,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":2,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5017794978","orcid":"https://orcid.org/0000-0001-8577-4547","observed_orcids":["https://orcid.org/0000-0001-8577-4547"]},"affiliations":[{"institution":{"id":"https://openalex.org/I14243506","ror":"https://ror.org/0030zas98","display_name":"Hong Kong Polytechnic University","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]},"years":[2026,2023]}],"last_known_institutions":[{"id":"https://openalex.org/I14243506","ror":"https://ror.org/0030zas98","display_name":"Hong Kong Polytechnic University","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10567","display_name":"Vehicle Routing Optimization Methods","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10586","display_name":"Robotic Path Planning Algorithms","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","count":1,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":1.04e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":8.1e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":6.9e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10567","display_name":"Vehicle Routing Optimization Methods","value":6.7e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10586","display_name":"Robotic Path Planning Algorithms","value":6.6e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","score":0.6242063045501709},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5779953002929688},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5341915488243103},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.3847000002861023},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.0}],"counts_by_year":[{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":27},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":35}],"display_name_alternatives":["C.K.M. Lee"],"block_key":"c lee","works_api_url":"https://api.openalex.org/works?filter=author.id:A5017794978","updated_date":"2026-11-04T11:47:51","created_date":"2023-04-15T00:00:00"}