{"id":"https://openalex.org/A5017453449","orcid":"https://orcid.org/0000-0001-7713-5753","observed_orcids":["https://orcid.org/0000-0001-7713-5753"],"display_name":"Ye-In Park","raw_author_names":["Ye-In Park"],"full_name":"Ye-In Park","works_count":4,"cited_by_count":26,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":2,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5017453449","orcid":"https://orcid.org/0000-0001-7713-5753","observed_orcids":["https://orcid.org/0000-0001-7713-5753"]},"affiliations":[{"institution":{"id":"https://openalex.org/I148751991","ror":"https://ror.org/056tn4839","display_name":"Sogang University","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]},"years":[2025,2022]}],"last_known_institutions":[{"id":"https://openalex.org/I148751991","ror":"https://ror.org/056tn4839","display_name":"Sogang University","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":2,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","value":1.48e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","value":1.22e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":8.1e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":6.9e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7193065881729126},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7168012857437134},{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.4829918146133423},{"id":"121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","score":0.4478875696659088},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2107255458831787}],"counts_by_year":[{"year":2022,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":11},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":8}],"display_name_alternatives":["Ye-In Park"],"block_key":"y park","works_api_url":"https://api.openalex.org/works?filter=author.id:A5017453449","awards_count":0,"updated_date":"2026-10-27T12:30:23","created_date":"2022-06-29T00:00:00"}