{"id":"https://openalex.org/A5017240160","orcid":"https://orcid.org/0000-0001-7927-2057","observed_orcids":["https://orcid.org/0000-0001-7927-2057"],"display_name":"Takashi Miyawaki","raw_author_names":["Takashi Miyawaki","\u30df\u30e4\u30ef\u30ad, \u30bf\u30ab\u30b7"],"full_name":"Takashi Miyawaki","works_count":7,"cited_by_count":6,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5017240160","orcid":"https://orcid.org/0000-0001-7927-2057","observed_orcids":["https://orcid.org/0000-0001-7927-2057"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210106587","ror":"https://ror.org/01bvqg661","display_name":"Nikon (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210106587"]},"years":[2023,2022]}],"last_known_institutions":[{"id":"https://openalex.org/I4210106587","ror":"https://ror.org/01bvqg661","display_name":"Nikon (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210106587"]}],"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":6,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":1,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","count":1,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":5.18e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":3.83e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":2e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":4.5e-06,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","value":4.3e-06,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7830142974853516},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6665427684783936},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5490104556083679},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.36940616369247437},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.22534388303756714}],"counts_by_year":[{"year":2022,"works_count":5,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Takashi Miyawaki","\u30df\u30e4\u30ef\u30ad, \u30bf\u30ab\u30b7"],"block_key":"t miyawaki","works_api_url":"https://api.openalex.org/works?filter=author.id:A5017240160","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5017240160","updated_date":"2026-11-12T13:17:38","created_date":"2022-06-19T00:00:00"}