{"id":"https://openalex.org/A5015722329","orcid":"https://orcid.org/0000-0001-6360-0351","observed_orcids":["https://orcid.org/0000-0001-6360-0351"],"display_name":"Rinat R. Diyazitdinov","raw_author_names":["R. Diyazitdinov","R. R. Diyazitdinov","R.R. Diyazitdinov","Rinat Diyazitdinov","Rinat R. Diyazitdinov","Rinat Radmirovich Diyazitdinov"],"full_name":"Rinat R. Diyazitdinov","works_count":32,"cited_by_count":23,"summary_stats":{"2yr_mean_citedness":0.3333333333333333,"h_index":3,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5015722329","orcid":"https://orcid.org/0000-0001-6360-0351","observed_orcids":["https://orcid.org/0000-0001-6360-0351"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210145445","ror":"https://ror.org/050q60w23","display_name":"Povolzhskiy State University of Telecommunications and Informatics","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210145445"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017,2016]}],"last_known_institutions":[{"id":"https://openalex.org/I4210145445","ror":"https://ror.org/050q60w23","display_name":"Povolzhskiy State University of Telecommunications and Informatics","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210145445"]}],"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":16,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","count":9,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","count":7,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":5,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":7.05e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","value":6.64e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13579","display_name":"Image and Video Stabilization","value":5.8e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","value":4.42e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","value":3.54e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7435067892074585},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6935844421386719},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.6815906167030334},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6362180113792419},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.49247702956199646}],"counts_by_year":[{"year":2016,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":2},{"year":2019,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2020,"works_count":5,"oa_works_count":1,"cited_by_count":1},{"year":2021,"works_count":4,"oa_works_count":1,"cited_by_count":3},{"year":2022,"works_count":5,"oa_works_count":2,"cited_by_count":1},{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":3},{"year":2024,"works_count":4,"oa_works_count":3,"cited_by_count":9},{"year":2025,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2026,"works_count":3,"oa_works_count":3,"cited_by_count":3}],"display_name_alternatives":["R. Diyazitdinov","R. R. Diyazitdinov","R.R. Diyazitdinov","Rinat Diyazitdinov","Rinat R. Diyazitdinov","Rinat Radmirovich Diyazitdinov"],"block_key":"r diyazitdinov","works_api_url":"https://api.openalex.org/works?filter=author.id:A5015722329","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}