{"id":"https://openalex.org/A5014746963","orcid":"https://orcid.org/0000-0002-3181-8476","observed_orcids":["https://orcid.org/0000-0002-3181-8476"],"display_name":"Yu. Palennyy","raw_author_names":["Lyudmyla \u041c. Perperi","Yu. Palennyy","Yuriy Palennyy"],"full_name":"Yu. Palennyy","works_count":6,"cited_by_count":2,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5014746963","orcid":"https://orcid.org/0000-0002-3181-8476","observed_orcids":["https://orcid.org/0000-0002-3181-8476"]},"affiliations":[{"institution":{"id":"https://openalex.org/I40179345","ror":"https://ror.org/05xaz0w84","display_name":"Odes\u0430 Polytechnic National University","country_code":"UA","type":"education","lineage":["https://openalex.org/I40179345"]},"years":[2026,2024,2023,2021,2018]}],"last_known_institutions":[{"id":"https://openalex.org/I40179345","ror":"https://ror.org/05xaz0w84","display_name":"Odes\u0430 Polytechnic National University","country_code":"UA","type":"education","lineage":["https://openalex.org/I40179345"]}],"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":2,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12905","display_name":"Management Systems and Quality Improvement","count":2,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13164","display_name":"Quality and Management Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13858","display_name":"Technical Engine Diagnostics and Monitoring","value":1.97e-05,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","value":1.22e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":1.1e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","value":8.6e-06,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13164","display_name":"Quality and Management Systems","value":8.5e-06,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"x_concepts":[{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5048999786376953},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.46781206130981445},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.37369999289512634},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.2542000114917755},{"id":"111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","score":0.11443981528282166}],"counts_by_year":[{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Lyudmyla \u041c. Perperi","Yu. Palennyy","Yuriy Palennyy"],"block_key":"y palennyy","works_api_url":"https://api.openalex.org/works?filter=author.id:A5014746963","awards_count":0,"updated_date":"2026-11-04T11:47:51","created_date":"2018-07-10T00:00:00"}