{"id":"https://openalex.org/A5013065767","orcid":"https://orcid.org/0009-0004-7127-9069","observed_orcids":["https://orcid.org/0009-0004-7127-9069"],"display_name":"Say Phommakesone","raw_author_names":["S. Phommakesone","Say Phommakesone"],"full_name":"Say Phommakesone","works_count":9,"cited_by_count":22,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":3,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5013065767","orcid":"https://orcid.org/0009-0004-7127-9069","observed_orcids":["https://orcid.org/0009-0004-7127-9069"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210098220","ror":"https://ror.org/01155gk87","display_name":"Keysight Technologies (Singapore)","country_code":"SG","type":"company","lineage":["https://openalex.org/I4210098220","https://openalex.org/I4210115805"]},"years":[2026,2024,2023,2021]},{"institution":{"id":"https://openalex.org/I4210115805","ror":"https://ror.org/02903cd17","display_name":"Keysight Technologies (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210115805"]},"years":[2026,2024,2023,2022,2021]},{"institution":{"id":"https://openalex.org/I4210129523","ror":"https://ror.org/036y1an55","display_name":"Keysight Technologies (Austria)","country_code":"AT","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210129523"]},"years":[2026,2024,2023,2021]},{"institution":{"id":"https://openalex.org/I4210149610","ror":"https://ror.org/04g81mm64","display_name":"Keysight Technologies (United Kingdom)","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210149610"]},"years":[2026,2024,2023,2021]}],"last_known_institutions":[{"id":"https://openalex.org/I4210098220","ror":"https://ror.org/01155gk87","display_name":"Keysight Technologies (Singapore)","country_code":"SG","type":"company","lineage":["https://openalex.org/I4210098220","https://openalex.org/I4210115805"]},{"id":"https://openalex.org/I4210115805","ror":"https://ror.org/02903cd17","display_name":"Keysight Technologies (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210115805"]},{"id":"https://openalex.org/I4210129523","ror":"https://ror.org/036y1an55","display_name":"Keysight Technologies (Austria)","country_code":"AT","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210129523"]},{"id":"https://openalex.org/I4210149610","ror":"https://ror.org/04g81mm64","display_name":"Keysight Technologies (United Kingdom)","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210149610"]}],"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":2,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":5.31e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":5.23e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","value":1.02e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":9e-06,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":6.8e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","score":0.656078577041626},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.5972087979316711},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.5167999863624573},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.4417889416217804},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2903999984264374}],"counts_by_year":[{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":2,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":4},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":5},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":6}],"display_name_alternatives":["S. Phommakesone","Say Phommakesone"],"block_key":"s phommakesone","works_api_url":"https://api.openalex.org/works?filter=author.id:A5013065767","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5013065767","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}