{"id":"https://openalex.org/A5012516698","orcid":"https://orcid.org/0000-0002-0217-2995","observed_orcids":["https://orcid.org/0000-0002-0217-2995"],"display_name":"Dican Hou","raw_author_names":["D. H. Hou","Dican Hou"],"full_name":"Dican Hou","works_count":10,"cited_by_count":85,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5012516698","orcid":"https://orcid.org/0000-0002-0217-2995","observed_orcids":["https://orcid.org/0000-0002-0217-2995"]},"affiliations":[{"institution":{"id":"https://openalex.org/I150229711","ror":"https://ror.org/04qr3zq92","display_name":"University of Electronic Science and Technology of China","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},"years":[2023,2022,2021,2020]},{"institution":{"id":"https://openalex.org/I4210120917","ror":"https://ror.org/02wx79d08","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I4391767659","ror":"https://ror.org/01t9yse95","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","country_code":"CN","type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]},"years":[2023,2022,2021,2020]}],"last_known_institutions":[{"id":"https://openalex.org/I150229711","ror":"https://ror.org/04qr3zq92","display_name":"University of Electronic Science and Technology of China","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4391767659","ror":"https://ror.org/01t9yse95","display_name":"State Key Laboratory of Electronic Thin Films and Integrated Devices","country_code":"CN","type":"facility","lineage":["https://openalex.org/I150229711","https://openalex.org/I4391767659"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","count":2,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":3.08e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":2.13e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":1.98e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","value":1.66e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","value":1.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.7005584239959717},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6370270252227783},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5564842820167542},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.470187783241272},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.30984437465667725}],"counts_by_year":[{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":5,"oa_works_count":1,"cited_by_count":2},{"year":2022,"works_count":2,"oa_works_count":0,"cited_by_count":18},{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":15},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":20}],"display_name_alternatives":["D. H. Hou","Dican Hou"],"block_key":"d hou","works_api_url":"https://api.openalex.org/works?filter=author.id:A5012516698","updated_date":"2026-10-28T12:34:19","created_date":"2020-08-21T00:00:00"}