{"id":"https://openalex.org/A5012276334","orcid":"https://orcid.org/0000-0003-4933-053X","observed_orcids":["https://orcid.org/0000-0003-4933-053X"],"display_name":"Makoto Tohara","raw_author_names":["M. Tohara","Makoto Tohara","Makoto Toharaand","Tohara, Makoto"],"full_name":"Makoto Toharaand","works_count":18,"cited_by_count":63,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5012276334","orcid":"https://orcid.org/0000-0003-4933-053X","observed_orcids":["https://orcid.org/0000-0003-4933-053X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I118347220","ror":"https://ror.org/04jndar25","display_name":"NEC (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]},"years":[2006,2005]},{"institution":{"id":"https://openalex.org/I188815454","ror":"https://ror.org/01nyv7k26","display_name":"Oita University","country_code":"JP","type":"education","lineage":["https://openalex.org/I188815454"]},"years":[2021,2019,2018]},{"institution":{"id":"https://openalex.org/I20529979","ror":"https://ror.org/02x73b849","display_name":"University of Electro-Communications","country_code":"JP","type":"education","lineage":["https://openalex.org/I20529979"]},"years":[2004,2000,1999]},{"institution":{"id":"https://openalex.org/I4210143778","ror":"https://ror.org/04v6bh038","display_name":"Fukuoka Industrial Technology Center","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4210143778"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I4405265657","ror":"https://ror.org/05d0w7e76","display_name":"NON-Destructive Inspection Co., Ltd. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405265657"]},"years":[2023,2021,2020]}],"last_known_institutions":[{"id":"https://openalex.org/I4210143778","ror":"https://ror.org/04v6bh038","display_name":"Fukuoka Industrial Technology Center","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4210143778"]}],"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":13,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","count":9,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","count":3,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":6.31e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","value":6.17e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","value":5.59e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13232","display_name":"Laser-Ablation Synthesis of Nanoparticles","value":3.11e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","value":2.85e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7769879102706909},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.3973180055618286},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3665403723716736},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.32860201597213745},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.0}],"counts_by_year":[{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2020,"works_count":2,"oa_works_count":0,"cited_by_count":1},{"year":2021,"works_count":4,"oa_works_count":4,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2023,"works_count":3,"oa_works_count":1,"cited_by_count":10},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":2,"oa_works_count":1,"cited_by_count":2}],"display_name_alternatives":["M. Tohara","Makoto Tohara","Makoto Toharaand","Tohara, Makoto"],"block_key":"m toharaand","works_api_url":"https://api.openalex.org/works?filter=author.id:A5012276334","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5012276334","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}