{"id":"https://openalex.org/A5011611005","orcid":"https://orcid.org/0000-0002-6143-2881","observed_orcids":["https://orcid.org/0000-0002-6143-2881"],"display_name":"Manuel Kasper","raw_author_names":["Kasper, Manuel","M Kasper","M. Kasper","Manuel Kasper"],"full_name":"Kasper, Manuel","works_count":62,"cited_by_count":795,"summary_stats":{"2yr_mean_citedness":0.8125,"h_index":15,"i10_index":20},"ids":{"openalex":"https://openalex.org/A5011611005","orcid":"https://orcid.org/0000-0002-6143-2881","observed_orcids":["https://orcid.org/0000-0002-6143-2881"]},"affiliations":[{"institution":{"id":"https://openalex.org/I121883995","ror":"https://ror.org/052r2xn60","display_name":"Johannes Kepler University of Linz","country_code":"AT","type":"education","lineage":["https://openalex.org/I121883995"]},"years":[2016,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I4210098220","ror":"https://ror.org/01155gk87","display_name":"Keysight Technologies (Singapore)","country_code":"SG","type":"company","lineage":["https://openalex.org/I4210098220","https://openalex.org/I4210115805"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4210115805","ror":"https://ror.org/02903cd17","display_name":"Keysight Technologies (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210115805"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4210129523","ror":"https://ror.org/036y1an55","display_name":"Keysight Technologies (Austria)","country_code":"AT","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210129523"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017,2016]},{"institution":{"id":"https://openalex.org/I4210149610","ror":"https://ror.org/04g81mm64","display_name":"Keysight Technologies (United Kingdom)","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210149610"]},"years":[2019]}],"last_known_institutions":[{"id":"https://openalex.org/I4210129523","ror":"https://ror.org/036y1an55","display_name":"Keysight Technologies (Austria)","country_code":"AT","type":"company","lineage":["https://openalex.org/I4210115805","https://openalex.org/I4210129523"]}],"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":26,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Battery Modeling and Management","count":25,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","count":19,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","count":19,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":0.0001725,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","value":0.000115,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":9.9e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Battery Modeling and Management","value":9.19e-05,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":6.94e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9055768251419067},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7309201955795288},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.454800009727478},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3410465121269226},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.0}],"counts_by_year":[{"year":2013,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":3,"oa_works_count":1,"cited_by_count":9},{"year":2015,"works_count":6,"oa_works_count":3,"cited_by_count":31},{"year":2016,"works_count":5,"oa_works_count":2,"cited_by_count":64},{"year":2017,"works_count":5,"oa_works_count":3,"cited_by_count":86},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":47},{"year":2019,"works_count":2,"oa_works_count":2,"cited_by_count":41},{"year":2020,"works_count":3,"oa_works_count":1,"cited_by_count":39},{"year":2021,"works_count":7,"oa_works_count":7,"cited_by_count":53},{"year":2022,"works_count":4,"oa_works_count":4,"cited_by_count":54},{"year":2023,"works_count":7,"oa_works_count":6,"cited_by_count":81},{"year":2024,"works_count":2,"oa_works_count":2,"cited_by_count":100},{"year":2025,"works_count":4,"oa_works_count":4,"cited_by_count":99},{"year":2026,"works_count":10,"oa_works_count":10,"cited_by_count":91}],"display_name_alternatives":["Kasper, Manuel","M Kasper","M. Kasper","Manuel Kasper"],"block_key":"m kasper","works_api_url":"https://api.openalex.org/works?filter=author.id:A5011611005","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5011611005","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}