{"id":"https://openalex.org/A5009055433","orcid":"https://orcid.org/0009-0008-7184-1030","observed_orcids":["https://orcid.org/0009-0008-7184-1030"],"display_name":"H. Bousbia","raw_author_names":["BOUSBIA, Hind","Bousbia, Hind","H. Bousbia","Hind Bousbia"],"full_name":"Bousbia, Hind","works_count":17,"cited_by_count":28,"summary_stats":{"2yr_mean_citedness":0.125,"h_index":3,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5009055433","orcid":"https://orcid.org/0009-0008-7184-1030","observed_orcids":["https://orcid.org/0009-0008-7184-1030"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2006,2005]},{"institution":{"id":"https://openalex.org/I4210086359","ror":"https://ror.org/001rww263","display_name":"Murata (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210086359","https://openalex.org/I924388194"]},"years":[2026,2025,2024]},{"institution":{"id":"https://openalex.org/I4210093397","ror":"https://ror.org/00f7srh09","display_name":"XLIM","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I32881790","https://openalex.org/I4210093397","https://openalex.org/I4210095849","https://openalex.org/I65806277"]},"years":[2006]},{"institution":{"id":"https://openalex.org/I4210165303","ror":"https://ror.org/05sqf9v67","display_name":"Safran (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210165303"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I65806277","ror":"https://ror.org/02cp04407","display_name":"Universit\u00e9 de Limoges","country_code":"FR","type":"education","lineage":["https://openalex.org/I65806277"]},"years":[2006,2005]}],"last_known_institutions":[{"id":"https://openalex.org/I4210086359","ror":"https://ror.org/001rww263","display_name":"Murata (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210086359","https://openalex.org/I924388194"]}],"topics":[{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":4,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":3,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","value":6.52e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":3.95e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","value":1.79e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":1.41e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":1.37e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8345000147819519},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5738288164138794},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5083791613578796},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.38081586360931396},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2678811252117157}],"counts_by_year":[{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":7,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":5,"oa_works_count":2,"cited_by_count":1},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["BOUSBIA, Hind","Bousbia, Hind","H. Bousbia","Hind Bousbia"],"block_key":"h bousbia","works_api_url":"https://api.openalex.org/works?filter=author.id:A5009055433","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5009055433","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}