{"id":"https://openalex.org/A5008961333","orcid":null,"observed_orcids":[],"display_name":"L. M. Zaks","raw_author_names":["L. M. Zaks","L.M. Zaks"],"full_name":"L. M. Zaks","works_count":40,"cited_by_count":19,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5008961333","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210144836","ror":"https://ror.org/03ekph544","display_name":"All-Russian research Institute of metrological service","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210144836","https://openalex.org/I4405257749"]},"years":[1975]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":34,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":21,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":20,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","count":7,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13164","display_name":"Quality and Management Systems","count":6,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":0.0001478,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":0.0001378,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":0.0001061,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","value":2.9e-05,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13164","display_name":"Quality and Management Systems","value":2.44e-05,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"x_concepts":[{"id":"195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","score":0.8699852824211121},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5498539805412292},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4159315228462219},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.2992349863052368},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.26137492060661316}],"counts_by_year":[{"year":1959,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1961,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1962,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1964,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1965,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1971,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1974,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1975,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":1976,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1977,"works_count":10,"oa_works_count":0,"cited_by_count":0},{"year":1978,"works_count":2,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["L. M. Zaks","L.M. Zaks"],"block_key":"l zaks","works_api_url":"https://api.openalex.org/works?filter=author.id:A5008961333","updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}