{"id":"https://openalex.org/A5006845496","orcid":null,"observed_orcids":[],"display_name":"Khiem Ly","raw_author_names":["Khiem Ly"],"full_name":"Khiem Ly","works_count":20,"cited_by_count":15,"summary_stats":{"2yr_mean_citedness":0.5,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5006845496","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210123704","ror":"https://ror.org/0268h4j55","display_name":"NXP (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]},"years":[2024,2017]},{"institution":{"id":"https://openalex.org/I4210140035","ror":"https://ror.org/054fc6480","display_name":"NXP (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210140035"]},"years":[2026,2025,2024,2023,2022,2019]}],"last_known_institutions":[{"id":"https://openalex.org/I4210140035","ror":"https://ror.org/054fc6480","display_name":"NXP (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210140035"]}],"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":20,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":12,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":11,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":4,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0002832,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":0.0001565,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","value":5.91e-05,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":4.17e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":1.19e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8413830995559692},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5675258636474609},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5235861539840698},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.43209999799728394},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3520508110523224}],"counts_by_year":[{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2023,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2024,"works_count":3,"oa_works_count":0,"cited_by_count":2},{"year":2025,"works_count":2,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Khiem Ly"],"block_key":"k ly","works_api_url":"https://api.openalex.org/works?filter=author.id:A5006845496","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2017-09-25T00:00:00"}