{"id":"https://openalex.org/A5006140648","orcid":"https://orcid.org/0000-0002-4163-5761","observed_orcids":["https://orcid.org/0000-0002-4163-5761"],"display_name":"Tobias Binkele","raw_author_names":["Binkele, Tobias","T. Binkele","Tobias Binkele"],"full_name":"Tobias Binkele","works_count":24,"cited_by_count":53,"summary_stats":{"2yr_mean_citedness":0.6666666666666666,"h_index":4,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5006140648","orcid":"https://orcid.org/0000-0002-4163-5761","observed_orcids":["https://orcid.org/0000-0002-4163-5761"]},"affiliations":[{"institution":{"id":"https://openalex.org/I166433441","ror":"https://ror.org/04f7jc139","display_name":"Hochschule Bremen","country_code":"DE","type":"education","lineage":["https://openalex.org/I166433441"]},"years":[2021,2020,2019,2018,2017,2016]},{"institution":{"id":"https://openalex.org/I180437899","ror":"https://ror.org/04ers2y35","display_name":"University of Bremen","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]},"years":[2021,2019]},{"institution":{"id":"https://openalex.org/I33256026","ror":"https://ror.org/01ayc5b57","display_name":"German Research Centre for Artificial Intelligence","country_code":"DE","type":"funder","lineage":["https://openalex.org/I33256026"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I4210107695","ror":"https://ror.org/01jrywz31","display_name":"Optimare (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210107695"]},"years":[2025,2024]}],"last_known_institutions":[{"id":"https://openalex.org/I4210107695","ror":"https://ror.org/01jrywz31","display_name":"Optimare (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210107695"]}],"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":17,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":17,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":12,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","count":4,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10753","display_name":"Microplastics and Plastic Pollution","count":4,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":0.0001038,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","value":7.17e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":5.7e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10753","display_name":"Microplastics and Plastic Pollution","value":3.39e-05,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12316","display_name":"Oil Spill Detection and Mitigation","value":2.45e-05,"subfield":{"id":"https://openalex.org/subfields/2310","display_name":"Pollution"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121483023","wikidata":"https://www.wikidata.org/wiki/Q7298343","display_name":"Ray tracing (physics)","score":0.9300338625907898},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8049793839454651},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7593275308609009},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.44671767950057983},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.23506397008895874}],"counts_by_year":[{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":3,"oa_works_count":0,"cited_by_count":7},{"year":2018,"works_count":3,"oa_works_count":0,"cited_by_count":2},{"year":2019,"works_count":6,"oa_works_count":2,"cited_by_count":14},{"year":2020,"works_count":2,"oa_works_count":1,"cited_by_count":4},{"year":2021,"works_count":2,"oa_works_count":2,"cited_by_count":8},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":5},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":2,"oa_works_count":0,"cited_by_count":4},{"year":2025,"works_count":4,"oa_works_count":3,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Binkele, Tobias","T. Binkele","Tobias Binkele"],"block_key":"t binkele","works_api_url":"https://api.openalex.org/works?filter=author.id:A5006140648","awards_count":0,"updated_date":"2026-11-04T11:47:51","created_date":"2016-09-16T00:00:00"}