{"id":"https://openalex.org/A5006059367","orcid":"https://orcid.org/0000-0002-3315-1281","observed_orcids":["https://orcid.org/0000-0002-3315-1281"],"display_name":"Jaros\u0142aw Fastowicz","raw_author_names":["Jaroslaw Fastowicz","Jaros\u0142aw Fastowicz"],"full_name":"Jaroslaw Fastowicz","works_count":28,"cited_by_count":362,"summary_stats":{"2yr_mean_citedness":2.0,"h_index":12,"i10_index":14},"ids":{"openalex":"https://openalex.org/A5006059367","orcid":"https://orcid.org/0000-0002-3315-1281","observed_orcids":["https://orcid.org/0000-0002-3315-1281"]},"affiliations":[{"institution":{"id":"https://openalex.org/I104588304","ror":"https://ror.org/05vmz5070","display_name":"University of Szczecin","country_code":"PL","type":"education","lineage":["https://openalex.org/I104588304"]},"years":[2015]},{"institution":{"id":"https://openalex.org/I155313962","ror":"https://ror.org/0596m7f19","display_name":"West Pomeranian University of Technology in Szczecin","country_code":"PL","type":"education","lineage":["https://openalex.org/I155313962"]},"years":[2026,2025,2022,2021,2020,2019,2018,2017,2016,2015]}],"last_known_institutions":[{"id":"https://openalex.org/I155313962","ror":"https://ror.org/0596m7f19","display_name":"West Pomeranian University of Technology in Szczecin","country_code":"PL","type":"education","lineage":["https://openalex.org/I155313962"]}],"topics":[{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","count":17,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","count":17,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":16,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11099","display_name":"Autonomous Vehicle Technology and Safety","count":3,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","value":9.83e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","value":7.35e-05,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":7.24e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","value":3.19e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","value":1.67e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8393988609313965},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.7816898822784424},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7451215386390686},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.5874254703521729},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2768403887748718}],"counts_by_year":[{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2015,"works_count":3,"oa_works_count":1,"cited_by_count":1},{"year":2016,"works_count":5,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":4,"oa_works_count":0,"cited_by_count":42},{"year":2018,"works_count":3,"oa_works_count":0,"cited_by_count":20},{"year":2019,"works_count":3,"oa_works_count":2,"cited_by_count":30},{"year":2020,"works_count":4,"oa_works_count":4,"cited_by_count":54},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":49},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":34},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":60},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2025,"works_count":2,"oa_works_count":2,"cited_by_count":29},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":18}],"display_name_alternatives":["Jaroslaw Fastowicz","Jaros\u0142aw Fastowicz"],"block_key":"j fastowicz","works_api_url":"https://api.openalex.org/works?filter=author.id:A5006059367","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}