{"id":"https://openalex.org/A5005740940","orcid":"https://orcid.org/0009-0001-2805-775X","observed_orcids":["https://orcid.org/0009-0001-2805-775X"],"display_name":"Di-Long Wu","raw_author_names":["Di-Long Wu","Di-long WU","Di-long Wu","Dilong Wu","Dilong wu","Wu Dilong"],"full_name":"Di-Long Wu","works_count":17,"cited_by_count":24,"summary_stats":{"2yr_mean_citedness":0.3333333333333333,"h_index":2,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5005740940","orcid":"https://orcid.org/0009-0001-2805-775X","observed_orcids":["https://orcid.org/0009-0001-2805-775X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I149594827","ror":"https://ror.org/05s92vm98","display_name":"Xidian University","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]},"years":[2024,2023]},{"institution":{"id":"https://openalex.org/I4387155340","ror":"https://ror.org/02ggaqt78","display_name":"Laser Fusion Research Center","country_code":"CN","type":"facility","lineage":["https://openalex.org/I2801345734","https://openalex.org/I4387155340"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I4402554102","ror":"https://ror.org/05r2q4835","display_name":"Chengdu Fine Optical Engineering Research Center","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4402554102"]},"years":[2023,2021,2020,2019]}],"last_known_institutions":[{"id":"https://openalex.org/I4387155340","ror":"https://ror.org/02ggaqt78","display_name":"Laser Fusion Research Center","country_code":"CN","type":"facility","lineage":["https://openalex.org/I2801345734","https://openalex.org/I4387155340"]}],"topics":[{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":11,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","count":6,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","count":4,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","value":4.51e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","value":2.67e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":2.5e-05,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","value":2.26e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":1.94e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8623015880584717},{"id":"15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","score":0.7525874376296997},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.661602258682251},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.4583550989627838},{"id":"24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","score":0.42572343349456787}],"counts_by_year":[{"year":2018,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2020,"works_count":4,"oa_works_count":1,"cited_by_count":2},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":6,"oa_works_count":0,"cited_by_count":4},{"year":2024,"works_count":2,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":6}],"display_name_alternatives":["Di-Long Wu","Di-long WU","Di-long Wu","Dilong Wu","Dilong wu","Wu Dilong"],"block_key":"d wu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5005740940","updated_date":"2026-10-31T12:29:50","created_date":"2018-10-26T00:00:00"}