{"id":"https://openalex.org/A5005313347","orcid":"https://orcid.org/0000-0003-1416-0198","observed_orcids":["https://orcid.org/0000-0003-1416-0198"],"display_name":"Lev K. Isaev","raw_author_names":["Issaev, L. K.","L K Isaev","L. K. Isaev","Lev K. Isaev"],"full_name":"Lev K. Isaev","works_count":34,"cited_by_count":56,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5005313347","orcid":"https://orcid.org/0000-0003-1416-0198","observed_orcids":["https://orcid.org/0000-0003-1416-0198"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210144836","ror":"https://ror.org/03ekph544","display_name":"All-Russian research Institute of metrological service","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210144836","https://openalex.org/I4405257749"]},"years":[2023,2021,2020,2015,2013,2012,2011,2008,2007,2006]},{"institution":{"id":"https://openalex.org/I883101600","ror":"https://ror.org/055vkyj43","display_name":"Bureau international des poids et mesures","country_code":"FR","type":"government","lineage":["https://openalex.org/I883101600"]},"years":[2011]}],"last_known_institutions":[{"id":"https://openalex.org/I4210144836","ror":"https://ror.org/03ekph544","display_name":"All-Russian research Institute of metrological service","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210144836","https://openalex.org/I4405257749"]}],"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":30,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","count":5,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":0.0001352,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":5.49e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":5.4e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13898","display_name":"Diverse Interdisciplinary Research Studies","value":3.59e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","value":3.06e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","score":0.9223816394805908},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7978072166442871},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6778460741043091},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.6572269797325134},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.46847739815711975}],"counts_by_year":[{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1980,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2015,"works_count":2,"oa_works_count":0,"cited_by_count":1},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":3,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2023,"works_count":5,"oa_works_count":2,"cited_by_count":7},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Issaev, L. K.","L K Isaev","L. K. Isaev","Lev K. Isaev"],"block_key":"l isaev","works_api_url":"https://api.openalex.org/works?filter=author.id:A5005313347","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5005313347","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}