{"id":"https://openalex.org/A5005244841","orcid":null,"observed_orcids":[],"display_name":"Mainak Mallick","raw_author_names":["Mainak Mallick","Mallick, Mainak"],"full_name":"Mainak Mallick","works_count":7,"cited_by_count":10,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5005244841","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I130701444","ror":"https://ror.org/01zkghx44","display_name":"Georgia Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},"years":[2026,2025]},{"institution":{"id":"https://openalex.org/I98365261","ror":"https://ror.org/02ytfzr55","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]},"years":[2021]}],"last_known_institutions":[{"id":"https://openalex.org/I130701444","ror":"https://ror.org/01zkghx44","display_name":"Georgia Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":3,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10891","display_name":"Radar Systems and Signal Processing","count":2,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10221","display_name":"Composite Structure Analysis and Optimization","count":1,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":1.97e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":1.01e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":1e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11115","display_name":"Topology Optimization in Engineering","value":8.7e-06,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10891","display_name":"Radar Systems and Signal Processing","value":8.2e-06,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6801999807357788},{"id":"175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","score":0.664900004863739},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5683000087738037},{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.5257999897003174},{"id":"152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","score":0.414900004863739}],"counts_by_year":[{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2026,"works_count":5,"oa_works_count":4,"cited_by_count":2}],"display_name_alternatives":["Mainak Mallick","Mallick, Mainak"],"block_key":"m mallick","works_api_url":"https://api.openalex.org/works?filter=author.id:A5005244841","updated_date":"2026-10-29T12:27:34","created_date":"2025-10-10T00:00:00"}