{"id":"https://openalex.org/A5003679025","orcid":"https://orcid.org/0009-0001-9923-3343","observed_orcids":["https://orcid.org/0009-0001-9923-3343"],"display_name":"Weiwei Si","raw_author_names":["Weiwei Si"],"full_name":"Weiwei Si","works_count":6,"cited_by_count":158,"summary_stats":{"2yr_mean_citedness":9.0,"h_index":5,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5003679025","orcid":"https://orcid.org/0009-0001-9923-3343","observed_orcids":["https://orcid.org/0009-0001-9923-3343"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210122543","ror":"https://ror.org/02pcb5m77","display_name":"Guangdong Polytechnic Normal University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122543"]},"years":[2025,2023,2022]}],"last_known_institutions":[{"id":"https://openalex.org/I4210122543","ror":"https://ror.org/02pcb5m77","display_name":"Guangdong Polytechnic Normal University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122543"]}],"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":6,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","count":1,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":2.42e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":2.06e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13857","display_name":"Mining and Industrial Processes","value":1.49e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.9045049548149109},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6103400588035583},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.4955493211746216},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3326304256916046},{"id":"127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","score":0.0}],"counts_by_year":[{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2023,"works_count":4,"oa_works_count":1,"cited_by_count":12},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":48},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":63}],"display_name_alternatives":["Weiwei Si"],"block_key":"w si","works_api_url":"https://api.openalex.org/works?filter=author.id:A5003679025","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5003679025","updated_date":"2026-11-12T13:17:38","created_date":"2022-09-28T00:00:00"}