{"id":"https://openalex.org/A5001292827","orcid":"https://orcid.org/0009-0001-0535-652X","observed_orcids":["https://orcid.org/0009-0001-0535-652X"],"display_name":"Ning Gan","raw_author_names":["Ning Gan"],"full_name":"Ning Gan","works_count":8,"cited_by_count":125,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5001292827","orcid":"https://orcid.org/0009-0001-0535-652X","observed_orcids":["https://orcid.org/0009-0001-0535-652X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I140221134","ror":"https://ror.org/0327f3359","display_name":"Anhui Agricultural University","country_code":"CN","type":"education","lineage":["https://openalex.org/I140221134"]},"years":[2022,2020,2018]},{"institution":{"id":"https://openalex.org/I4210110961","ror":"https://ror.org/01pw5qp76","display_name":"Anhui Academy of Agricultural Sciences","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210110961"]},"years":[2023]},{"institution":{"id":"https://openalex.org/I4210148107","ror":"https://ror.org/04rj1td02","display_name":"Space Engineering University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210148107"]},"years":[2026,2025]},{"institution":{"id":"https://openalex.org/I4405271931","ror":"https://ror.org/0398jwk60","display_name":"State Key Laboratory of Tea Plant Biology and Utilization","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4405271931"]},"years":[2022,2020,2018]},{"institution":{"id":"https://openalex.org/I74525822","ror":"https://ror.org/02d3fj342","display_name":"Hubei University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]},"years":[2023]}],"last_known_institutions":[{"id":"https://openalex.org/I4210148107","ror":"https://ror.org/04rj1td02","display_name":"Space Engineering University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210148107"]}],"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":4,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10616","display_name":"Smart Agriculture and AI","count":3,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","value":1.95e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11411","display_name":"Tea Polyphenols and Effects","value":1.9e-05,"subfield":{"id":"https://openalex.org/subfields/1106","display_name":"Food Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T14365","display_name":"Leaf Properties and Growth Measurement","value":1.9e-05,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":1.85e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","value":1.79e-05,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7074621319770813},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6868744492530823},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6570000052452087},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.5971873998641968},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.44055742025375366}],"counts_by_year":[{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":16},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":22},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":31},{"year":2026,"works_count":2,"oa_works_count":0,"cited_by_count":19}],"display_name_alternatives":["Ning Gan"],"block_key":"n gan","works_api_url":"https://api.openalex.org/works?filter=author.id:A5001292827","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2018-08-03T00:00:00"}