{"id":"https://openalex.org/A5000810293","orcid":"https://orcid.org/0000-0002-2378-2266","observed_orcids":["https://orcid.org/0000-0002-2378-2266"],"display_name":"Ruru Pan","raw_author_names":["R.R. Pan","R.R. Pan,","Ru Ru Pan","Ruru Pan"],"full_name":"Ruru Pan","works_count":161,"cited_by_count":1823,"summary_stats":{"2yr_mean_citedness":2.2285714285714286,"h_index":22,"i10_index":65},"ids":{"openalex":"https://openalex.org/A5000810293","orcid":"https://orcid.org/0000-0002-2378-2266","observed_orcids":["https://orcid.org/0000-0002-2378-2266"]},"affiliations":[{"institution":{"id":"https://openalex.org/I111599522","ror":"https://ror.org/04mkzax54","display_name":"Jiangnan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017,2016,2015,2014,2013,2012,2011,2010,2009]}],"last_known_institutions":[{"id":"https://openalex.org/I111599522","ror":"https://ror.org/04mkzax54","display_name":"Jiangnan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":96,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","count":82,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","count":52,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":27,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","count":26,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":0.0004363,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","value":0.0003133,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13027","display_name":"Applied Advanced Technologies","value":0.0002117,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","value":0.0001892,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","value":0.0001485,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.9287679195404053},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9125615358352661},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.8060640096664429},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.7969562411308289},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.6176432371139526}],"counts_by_year":[{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":32},{"year":2010,"works_count":9,"oa_works_count":1,"cited_by_count":201},{"year":2011,"works_count":6,"oa_works_count":2,"cited_by_count":56},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":47},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":22},{"year":2014,"works_count":7,"oa_works_count":0,"cited_by_count":107},{"year":2015,"works_count":10,"oa_works_count":2,"cited_by_count":237},{"year":2016,"works_count":16,"oa_works_count":3,"cited_by_count":134},{"year":2017,"works_count":4,"oa_works_count":1,"cited_by_count":30},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":8},{"year":2019,"works_count":14,"oa_works_count":9,"cited_by_count":250},{"year":2020,"works_count":13,"oa_works_count":4,"cited_by_count":308},{"year":2021,"works_count":16,"oa_works_count":3,"cited_by_count":152},{"year":2022,"works_count":15,"oa_works_count":6,"cited_by_count":123},{"year":2023,"works_count":8,"oa_works_count":2,"cited_by_count":38},{"year":2024,"works_count":12,"oa_works_count":3,"cited_by_count":54},{"year":2025,"works_count":15,"oa_works_count":2,"cited_by_count":21},{"year":2026,"works_count":8,"oa_works_count":2,"cited_by_count":3}],"display_name_alternatives":["R.R. Pan","R.R. Pan,","Ru Ru Pan","Ruru Pan"],"block_key":"r pan","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000810293","updated_date":"2026-10-18T12:41:17","created_date":"2017-08-31T00:00:00"}