{"id":"https://openalex.org/A5000803197","orcid":"https://orcid.org/0000-0003-2429-2258","observed_orcids":["https://orcid.org/0000-0003-2429-2258"],"display_name":"Wei Xu","raw_author_names":["Wei Xu"],"full_name":"Wei Xu","works_count":11,"cited_by_count":190,"summary_stats":{"2yr_mean_citedness":16.5,"h_index":4,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5000803197","orcid":"https://orcid.org/0000-0003-2429-2258","observed_orcids":["https://orcid.org/0000-0003-2429-2258"]},"affiliations":[{"institution":{"id":"https://openalex.org/I179060312","ror":"https://ror.org/00zqaxa34","display_name":"Northeast Electric Power University","country_code":"CN","type":"education","lineage":["https://openalex.org/I179060312"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I184681353","ror":"https://ror.org/00q9atg80","display_name":"Anhui University of Science and Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]},"years":[2012]},{"institution":{"id":"https://openalex.org/I209549992","ror":"https://ror.org/02q1hyx43","display_name":"Sanjiang University","country_code":"CN","type":"education","lineage":["https://openalex.org/I209549992"]},"years":[2026,2024,2020]},{"institution":{"id":"https://openalex.org/I4210120238","ror":"https://ror.org/01varr368","display_name":"PowerChina (China)","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210120238"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I4405273985","ror":"https://ror.org/00tv06f79","display_name":"Photonic Lattice, Inc. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405273985"]},"years":[2007]}],"last_known_institutions":[{"id":"https://openalex.org/I209549992","ror":"https://ror.org/02q1hyx43","display_name":"Sanjiang University","country_code":"CN","type":"education","lineage":["https://openalex.org/I209549992"]}],"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","count":3,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10462","display_name":"Reinforcement Learning in Robotics","count":2,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10767","display_name":"Advanced Photonic Communication Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":2,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","value":1.54e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":1.41e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":1.04e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11195","display_name":"Simulation Techniques and Applications","value":1.04e-05,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7439000010490417},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.650285542011261},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.39323893189430237},{"id":"127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","score":0.09537428617477417},{"id":"165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","score":0.0}],"counts_by_year":[{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":2,"oa_works_count":2,"cited_by_count":3},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":29},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":42},{"year":2026,"works_count":2,"oa_works_count":2,"cited_by_count":29}],"display_name_alternatives":["Wei Xu"],"block_key":"w xu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000803197","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5000803197","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}