{"id":"https://openalex.org/A5000779595","orcid":"https://orcid.org/0000-0001-9473-2285","observed_orcids":["https://orcid.org/0000-0001-9473-2285"],"display_name":"Serhii Matsepa","raw_author_names":["Matsepa Serhii","Serhii Matsepa","\u041c\u0430\u0446\u0435\u043f\u0430, \u0421\u0435\u0440\u0433\u0456\u0439","\u041c\u0430\u0446\u0435\u043f\u0430, \u0421\u0435\u0440\u0433\u0456\u0439 \u041c\u0438\u0445\u0430\u0439\u043b\u043e\u0432\u0438\u0447","\u0421. \u041c. \u041c\u0430\u0446\u0435\u043f\u0430","\u0421\u0435\u0440\u0433\u0456\u0439 \u041c\u0438\u0445\u0430\u0439\u043b\u043e\u0432\u0438\u0447 \u041c\u0430\u0446\u0435\u043f\u0430"],"full_name":"Serhii Matsepa","works_count":11,"cited_by_count":1,"summary_stats":{"2yr_mean_citedness":0.16666666666666666,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5000779595","orcid":"https://orcid.org/0000-0001-9473-2285","observed_orcids":["https://orcid.org/0000-0001-9473-2285"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210108895","ror":"https://ror.org/01m54ds80","display_name":"Cherkasy State Technological University","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210108895"]},"years":[2026,2025,2024,2020,2018]}],"last_known_institutions":[{"id":"https://openalex.org/I4210108895","ror":"https://ror.org/01m54ds80","display_name":"Cherkasy State Technological University","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210108895"]}],"topics":[{"id":"https://openalex.org/T10544","display_name":"Glass properties and applications","count":2,"subfield":{"id":"https://openalex.org/subfields/2503","display_name":"Ceramics and Composites"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":2,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14474","display_name":"Industrial Technology and Control Systems","value":1.42e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","value":1.39e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":1.08e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":9.1e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":8.9e-06,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6953999996185303},{"id":"95312477","wikidata":"https://www.wikidata.org/wiki/Q207340","display_name":"Cathode ray","score":0.5835964679718018},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.47582462430000305},{"id":"18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","score":0.36419999599456787},{"id":"116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","score":0.19499999284744263}],"counts_by_year":[{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2020,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2021,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2025,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2026,"works_count":2,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["Matsepa Serhii","Serhii Matsepa","\u041c\u0430\u0446\u0435\u043f\u0430, \u0421\u0435\u0440\u0433\u0456\u0439","\u041c\u0430\u0446\u0435\u043f\u0430, \u0421\u0435\u0440\u0433\u0456\u0439 \u041c\u0438\u0445\u0430\u0439\u043b\u043e\u0432\u0438\u0447","\u0421. \u041c. \u041c\u0430\u0446\u0435\u043f\u0430","\u0421\u0435\u0440\u0433\u0456\u0439 \u041c\u0438\u0445\u0430\u0439\u043b\u043e\u0432\u0438\u0447 \u041c\u0430\u0446\u0435\u043f\u0430"],"block_key":"s matsepa","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000779595","updated_date":"2026-10-12T12:34:37","created_date":"2025-10-10T00:00:00"}