{"id":"https://openalex.org/A5000729237","orcid":"https://orcid.org/0009-0008-6119-2882","observed_orcids":["https://orcid.org/0009-0008-6119-2882"],"display_name":"Heng Zhang","raw_author_names":["Heng Zhang","Zhang Heng"],"full_name":"Heng Zhang","works_count":7,"cited_by_count":144,"summary_stats":{"2yr_mean_citedness":0.5,"h_index":5,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5000729237","orcid":"https://orcid.org/0009-0008-6119-2882","observed_orcids":["https://orcid.org/0009-0008-6119-2882"]},"affiliations":[{"institution":{"id":"https://openalex.org/I10535382","ror":"https://ror.org/03dgaqz26","display_name":"Chongqing University of Posts and Telecommunications","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I184681353","ror":"https://ror.org/00q9atg80","display_name":"Anhui University of Science and Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]},"years":[2025,2023,2022]},{"institution":{"id":"https://openalex.org/I19820366","ror":"https://ror.org/034t30j35","display_name":"Chinese Academy of Sciences","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I2802624667","ror":"https://ror.org/046n57345","display_name":"Hefei Institutes of Physical Science","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},"years":[2025]}],"last_known_institutions":[{"id":"https://openalex.org/I10535382","ror":"https://ror.org/03dgaqz26","display_name":"Chongqing University of Posts and Telecommunications","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]},{"id":"https://openalex.org/I184681353","ror":"https://ror.org/00q9atg80","display_name":"Anhui University of Science and Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I184681353"]},{"id":"https://openalex.org/I19820366","ror":"https://ror.org/034t30j35","display_name":"Chinese Academy of Sciences","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","ror":"https://ror.org/046n57345","display_name":"Hefei Institutes of Physical Science","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":2,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","count":1,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13615","display_name":"Transportation Systems and Safety","value":1.24e-05,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":1.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14392","display_name":"Geoscience and Mining Technology","value":1.12e-05,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","value":1.09e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12357","display_name":"Digital Media Forensic Detection","value":9.6e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7259896993637085},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.7061713933944702},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6720795035362244},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.37172824144363403},{"id":"127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","score":0.2705000042915344}],"counts_by_year":[{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":9},{"year":2023,"works_count":4,"oa_works_count":2,"cited_by_count":134},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":1}],"display_name_alternatives":["Heng Zhang","Zhang Heng"],"block_key":"h zhang","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000729237","updated_date":"2026-10-16T12:29:29","created_date":"2025-10-10T00:00:00"}