{"id":"https://openalex.org/A5000491585","orcid":"https://orcid.org/0009-0002-5670-8326","observed_orcids":["https://orcid.org/0009-0002-5670-8326"],"display_name":"Zaal Azmaiparashvili","raw_author_names":["Z. A. Azmaiparashvili","Z. Azmaiparashvili","Zaal AZMAIPARASHVILI","Zaal Azmaiparashvili"],"full_name":"Zaal Azmaiparashvili","works_count":9,"cited_by_count":22,"summary_stats":{"2yr_mean_citedness":0.3333333333333333,"h_index":3,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5000491585","orcid":"https://orcid.org/0009-0002-5670-8326","observed_orcids":["https://orcid.org/0009-0002-5670-8326"]},"affiliations":[{"institution":{"id":"https://openalex.org/I131762061","ror":"https://ror.org/00aamz256","display_name":"Georgian Technical University","country_code":"GE","type":"education","lineage":["https://openalex.org/I131762061"]},"years":[2025,2024,2023,2021,2017]},{"institution":{"id":"https://openalex.org/I4210157430","ror":"https://ror.org/05f3yt521","display_name":"V. A. Trapeznikov Institute of Control Sciences","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210157430","https://openalex.org/I4210164537"]},"years":[2008]}],"last_known_institutions":[{"id":"https://openalex.org/I131762061","ror":"https://ror.org/00aamz256","display_name":"Georgian Technical University","country_code":"GE","type":"education","lineage":["https://openalex.org/I131762061"]}],"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","count":5,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10064","display_name":"Complex Network Analysis Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":2.71e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","value":2.14e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":1.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","value":1.07e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11249","display_name":"Wireless Power Transfer Systems","value":9.6e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6150747537612915},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.5180504322052002},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4572122097015381},{"id":"24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","score":0.44973671436309814},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3330012261867523}],"counts_by_year":[{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2021,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":5},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":14},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Z. A. Azmaiparashvili","Z. Azmaiparashvili","Zaal AZMAIPARASHVILI","Zaal Azmaiparashvili"],"block_key":"z azmaiparashvili","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000491585","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}