{"id":"https://openalex.org/A5000356984","orcid":"https://orcid.org/0000-0002-6041-653X","observed_orcids":["https://orcid.org/0000-0002-6041-653X"],"display_name":"Amreen Batool","raw_author_names":["AMREEN BATOOL","Amreen Batool","Batool, Amreen"],"full_name":"AMREEN BATOOL","works_count":30,"cited_by_count":676,"summary_stats":{"2yr_mean_citedness":20.944444444444443,"h_index":14,"i10_index":16},"ids":{"openalex":"https://openalex.org/A5000356984","orcid":"https://orcid.org/0000-0002-6041-653X","observed_orcids":["https://orcid.org/0000-0002-6041-653X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I198091727","ror":"https://ror.org/00xsr9m91","display_name":"Tiangong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]},"years":[2021,2020,2019]},{"institution":{"id":"https://openalex.org/I83202590","ror":"https://ror.org/05hnb4n85","display_name":"Jeju National University","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]},"years":[2026,2025,2024,2023,2022]}],"last_known_institutions":[{"id":"https://openalex.org/I83202590","ror":"https://ror.org/05hnb4n85","display_name":"Jeju National University","country_code":"KR","type":"education","lineage":["https://openalex.org/I83202590"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":11,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":8,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10862","display_name":"AI in cancer detection","count":6,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10616","display_name":"Smart Agriculture and AI","count":5,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11652","display_name":"Imbalanced Data Classification Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11652","display_name":"Imbalanced Data Classification Techniques","value":5.83e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12874","display_name":"Digital Imaging for Blood Diseases","value":5.12e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13720","display_name":"Benford\u2019s Law and Fraud Detection","value":3.98e-05,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":3.7e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12702","display_name":"Brain Tumor Detection and Classification","value":3.16e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8945000171661377},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7695691585540771},{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.7503069639205933},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.7353455424308777},{"id":"108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","score":0.5968000292778015}],"counts_by_year":[{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":3,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":3,"oa_works_count":1,"cited_by_count":11},{"year":2022,"works_count":2,"oa_works_count":2,"cited_by_count":37},{"year":2023,"works_count":3,"oa_works_count":2,"cited_by_count":30},{"year":2024,"works_count":4,"oa_works_count":3,"cited_by_count":103},{"year":2025,"works_count":7,"oa_works_count":4,"cited_by_count":239},{"year":2026,"works_count":7,"oa_works_count":5,"cited_by_count":252}],"display_name_alternatives":["AMREEN BATOOL","Amreen Batool","Batool, Amreen"],"block_key":"a batool","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000356984","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5000356984","updated_date":"2026-11-10T14:30:39","created_date":"2019-06-27T00:00:00"}