{"id":"https://openalex.org/A5000334911","orcid":null,"observed_orcids":[],"display_name":"R. Kukla","raw_author_names":["Kukla, Reiner","R. Kukla","Reiner Kukla"],"full_name":"Kukla, Reiner","works_count":15,"cited_by_count":241,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5000334911","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210117931","ror":"https://ror.org/02fm9ey65","display_name":"Mainzer Zentrum f\u00fcr Digitalit\u00e4t in den Geistes- und Kulturwissenschaften","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210117931"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I4210130199","ror":"https://ror.org/02ezvhm25","display_name":"Progenius","country_code":"DE","type":"education","lineage":["https://openalex.org/I4210130199"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I4210155686","ror":"https://ror.org/051tn6h07","display_name":"Heraeus (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210155686"]},"years":[1987]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","count":9,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","count":9,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","count":4,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Low-Pressure Plasma Processing and Diagnostics","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11782","display_name":"Magnetic Properties of Alloys","count":4,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","value":6.82e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","value":4.22e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11782","display_name":"Magnetic Properties of Alloys","value":1.94e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","value":1.71e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11523","display_name":"Nanomaterials and Printing Technologies","value":1.65e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","score":0.8544912934303284},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8525286912918091},{"id":"19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","score":0.5428573489189148},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.43202710151672363},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3023431897163391}],"counts_by_year":[{"year":1984,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":12}],"display_name_alternatives":["Kukla, Reiner","R. Kukla","Reiner Kukla"],"block_key":"r kukla","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000334911","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}