{"id":"https://openalex.org/A5000322142","orcid":"https://orcid.org/0000-0001-8801-4391","observed_orcids":["https://orcid.org/0000-0001-8801-4391"],"display_name":"Deeban Ramalingam","raw_author_names":["Deeban Ramalingam"],"full_name":"Deeban Ramalingam","works_count":4,"cited_by_count":43,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":3,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5000322142","orcid":"https://orcid.org/0000-0001-8801-4391","observed_orcids":["https://orcid.org/0000-0001-8801-4391"]},"affiliations":[{"institution":{"id":"https://openalex.org/I161318765","ror":"https://ror.org/046rm7j60","display_name":"University of California, Los Angeles","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I2801935854","ror":"https://ror.org/05gzmn429","display_name":"SLAC National Accelerator Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2801935854","https://openalex.org/I39565521","https://openalex.org/I97018004"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I4210136624","ror":"https://ror.org/02vkaa689","display_name":"Linac Coherent Light Source","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2801935854","https://openalex.org/I39565521","https://openalex.org/I4210136624","https://openalex.org/I97018004"]},"years":[2022]}],"last_known_institutions":[{"id":"https://openalex.org/I2801935854","ror":"https://ror.org/05gzmn429","display_name":"SLAC National Accelerator Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2801935854","https://openalex.org/I39565521","https://openalex.org/I97018004"]},{"id":"https://openalex.org/I4210136624","ror":"https://ror.org/02vkaa689","display_name":"Linac Coherent Light Source","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I2801935854","https://openalex.org/I39565521","https://openalex.org/I4210136624","https://openalex.org/I97018004"]}],"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10891","display_name":"Radar Systems and Signal Processing","count":2,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11162","display_name":"Enzyme Structure and Function","count":1,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":1.92e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","value":1.61e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":1.34e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","value":1.19e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10891","display_name":"Radar Systems and Signal Processing","value":8.2e-06,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.579206109046936},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.5282370448112488},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5156408548355103},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.45386505126953125},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.31844645738601685}],"counts_by_year":[{"year":2020,"works_count":3,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":8},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Deeban Ramalingam"],"block_key":"d ramalingam","works_api_url":"https://api.openalex.org/works?filter=author.id:A5000322142","updated_date":"2026-10-27T12:30:23","created_date":"2020-06-12T00:00:00"}